Predicting the quench sensitivity of Al-Zn-Mg-Cu alloys: A model for linear cooling and strengthening

Marco J Starink; Benjamin Milkereit; Yong Zhang; Paul Rometsch

doi:10.1016/j.matdes.2015.09.058

Predicting the quench sensitivity of Al-Zn-Mg-Cu alloys: A model for linear cooling and strengthening

Marco J Starink, Benjamin Milkereit, Yong Zhang, Paul Rometsch

Materials Science & Engineering

Research output: Contribution to journal › Article › Research › peer-review

90 Citations (Scopus)

Original language	English
Pages (from-to)	958 - 971
Number of pages	14
Journal	Materials & Design
Volume	88
DOIs	https://doi.org/10.1016/j.matdes.2015.09.058
Publication status	Published - 2015

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10.1016/j.matdes.2015.09.058

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@article{33de9addc9ad444194ddc06a69ff71ef,

title = "Predicting the quench sensitivity of Al-Zn-Mg-Cu alloys: A model for linear cooling and strengthening",

author = "Starink, {Marco J} and Benjamin Milkereit and Yong Zhang and Paul Rometsch",

year = "2015",

doi = "10.1016/j.matdes.2015.09.058",

language = "English",

volume = "88",

pages = "958 -- 971",

journal = "Materials & Design",

issn = "0264-1275",

publisher = "Elsevier",

}

TY - JOUR

T1 - Predicting the quench sensitivity of Al-Zn-Mg-Cu alloys: A model for linear cooling and strengthening

AU - Starink, Marco J

AU - Milkereit, Benjamin

AU - Zhang, Yong

AU - Rometsch, Paul

PY - 2015

Y1 - 2015

UR - http://www.sciencedirect.com/science/article/pii/S0264127515304688

U2 - 10.1016/j.matdes.2015.09.058

DO - 10.1016/j.matdes.2015.09.058

M3 - Article

SN - 0264-1275

VL - 88

SP - 958

EP - 971

JO - Materials & Design

JF - Materials & Design

ER -

Predicting the quench sensitivity of Al-Zn-Mg-Cu alloys: A model for linear cooling and strengthening

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Predicting the quench sensitivity of Al-Zn-Mg-Cu alloys: A model for linear cooling and strengthening

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