Predicting crash fault residence via simplified deep forest based on a reduced feature set

Kunsong Zhao, Jin Liu, Zhou Xu, Li Li, Meng Yan, Jiaojiao Yu, Yuxuan Zhou

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

4 Citations (Scopus)

Abstract

The software inevitably encounters the crash, which will take developers a large amount of effort to find the fault causing the crash (short for crashing fault). Developing automatic methods to identify the residence of the crashing fault is a crucial activity for software quality assurance. Researchers have proposed methods to predict whether the crashing fault resides in the stack trace based on the features collected from the stack trace and faulty code, aiming at saving the debugging effort for developers. However, previous work usually neglected the feature preprocessing operation towards the crash data and only used traditional classification models. In this paper, we propose a novel crashing fault residence prediction framework, called ConDF, which consists of a consistency based feature subset selection method and a state-of-The-Art deep forest model. More specifically, first, the feature selection method is used to obtain an optimal feature subset and reduce the feature dimension by reserving the representative features. Then, a simplified deep forest model is employed to build the classification model on the reduced feature set. The experiments on seven open source software projects show that our ConDF method performs significantly better than 17 baseline methods on three performance indicators.

Original languageEnglish
Title of host publicationProceedings - 2021 IEEE/ACM 29th International Conference on Program Comprehension, ICPC 2021
EditorsAnita Sarma, Fabio Palomba
Place of PublicationPiscataway NJ USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages242-252
Number of pages11
ISBN (Electronic)9781665414036
ISBN (Print)9781665414043
DOIs
Publication statusPublished - 2021
EventInternational Conference on Program Comprehension 2021 - Online, Madrid, Spain
Duration: 20 May 202121 May 2021
Conference number: 29th
https://ieeexplore.ieee.org/xpl/conhome/9462945/proceeding (Proceedings)

Publication series

NameIEEE International Conference on Program Comprehension
PublisherIEEE, Institute of Electrical and Electronics Engineers
Volume2021-May
ISSN (Print)2643-7147
ISSN (Electronic)2643-7171

Conference

ConferenceInternational Conference on Program Comprehension 2021
Abbreviated titleICPC 2021
Country/TerritorySpain
CityMadrid
Period20/05/2121/05/21
Internet address

Keywords

  • Crash localization
  • deep forest
  • feature subset selection
  • stack trace

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