Polarimetry-based far-field method for high-resolution optical microscopy

Oscar G. Rodríguez-Herrera; David Lara; Chris Dainty

doi:10.1117/12.902119

Polarimetry-based far-field method for high-resolution optical microscopy

Oscar G. Rodríguez-Herrera, David Lara, Chris Dainty

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Abstract

We present a polarimetry-based far-field method for high-resolution optical microscopy. The method is based on the measurement of scattering-angle-resolved polarization state distributions across the exit pupil of a high numerical aperture objective lens and allows us to distinguish between different sub-resolution objects with no need for an active scanning. Our numerical and experimental results show that the scattering-angle-resolved polarization state distributions can be used in the characterization of particles and structures with features below or at the edge of the Rayleigh resolution limit.

Original language	English
Title of host publication	22nd Congress of the International Commission for Optics
Subtitle of host publication	Light for the Development of the World
Publisher	SPIE - International Society for Optical Engineering
ISBN (Print)	9780819485854
DOIs	https://doi.org/10.1117/12.902119
Publication status	Published - 2011
Externally published	Yes
Event	Congress of the International Commission for Optics 2011 - Puebla, Mexico Duration: 15 Aug 2011 → 19 Aug 2011 Conference number: 22nd https://spie.org/Publications/Proceedings/Volume/8011?SSO=1 (Proceedings)

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	8011
ISSN (Print)	0277-786X

Conference

Conference	Congress of the International Commission for Optics 2011
Country/Territory	Mexico
City	Puebla
Period	15/08/11 → 19/08/11
Internet address	https://spie.org/Publications/Proceedings/Volume/8011?SSO=1 (Proceedings)

Keywords

high numerical aperture optical systems
high-resolution optical microscopy
Polarimetry

Access to Document

10.1117/12.902119

Cite this

Rodríguez-Herrera, O. G., Lara, D., & Dainty, C. (2011). Polarimetry-based far-field method for high-resolution optical microscopy. In 22nd Congress of the International Commission for Optics: Light for the Development of the World Article 80110V (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8011). SPIE - International Society for Optical Engineering. https://doi.org/10.1117/12.902119

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title = "Polarimetry-based far-field method for high-resolution optical microscopy",

abstract = "We present a polarimetry-based far-field method for high-resolution optical microscopy. The method is based on the measurement of scattering-angle-resolved polarization state distributions across the exit pupil of a high numerical aperture objective lens and allows us to distinguish between different sub-resolution objects with no need for an active scanning. Our numerical and experimental results show that the scattering-angle-resolved polarization state distributions can be used in the characterization of particles and structures with features below or at the edge of the Rayleigh resolution limit.",

keywords = "high numerical aperture optical systems, high-resolution optical microscopy, Polarimetry",

author = "Rodr{\'i}guez-Herrera, \{Oscar G.\} and David Lara and Chris Dainty",

year = "2011",

doi = "10.1117/12.902119",

language = "English",

isbn = "9780819485854",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE - International Society for Optical Engineering",

booktitle = "22nd Congress of the International Commission for Optics",

address = "United States of America",

note = "Congress of the International Commission for Optics 2011 ; Conference date: 15-08-2011 Through 19-08-2011",

url = "https://spie.org/Publications/Proceedings/Volume/8011?SSO=1",

}

Rodríguez-Herrera, OG, Lara, D & Dainty, C 2011, Polarimetry-based far-field method for high-resolution optical microscopy. in 22nd Congress of the International Commission for Optics: Light for the Development of the World., 80110V, Proceedings of SPIE - The International Society for Optical Engineering, vol. 8011, SPIE - International Society for Optical Engineering, Congress of the International Commission for Optics 2011, Puebla, Mexico, 15/08/11. https://doi.org/10.1117/12.902119

Polarimetry-based far-field method for high-resolution optical microscopy. / Rodríguez-Herrera, Oscar G.; Lara, David; Dainty, Chris.
22nd Congress of the International Commission for Optics: Light for the Development of the World. SPIE - International Society for Optical Engineering, 2011. 80110V (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8011).

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

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T1 - Polarimetry-based far-field method for high-resolution optical microscopy

AU - Rodríguez-Herrera, Oscar G.

AU - Lara, David

AU - Dainty, Chris

N1 - Conference code: 22nd

PY - 2011

Y1 - 2011

N2 - We present a polarimetry-based far-field method for high-resolution optical microscopy. The method is based on the measurement of scattering-angle-resolved polarization state distributions across the exit pupil of a high numerical aperture objective lens and allows us to distinguish between different sub-resolution objects with no need for an active scanning. Our numerical and experimental results show that the scattering-angle-resolved polarization state distributions can be used in the characterization of particles and structures with features below or at the edge of the Rayleigh resolution limit.

AB - We present a polarimetry-based far-field method for high-resolution optical microscopy. The method is based on the measurement of scattering-angle-resolved polarization state distributions across the exit pupil of a high numerical aperture objective lens and allows us to distinguish between different sub-resolution objects with no need for an active scanning. Our numerical and experimental results show that the scattering-angle-resolved polarization state distributions can be used in the characterization of particles and structures with features below or at the edge of the Rayleigh resolution limit.

KW - high numerical aperture optical systems

KW - high-resolution optical microscopy

KW - Polarimetry

UR - https://www.scopus.com/pages/publications/84858425299

U2 - 10.1117/12.902119

DO - 10.1117/12.902119

M3 - Conference Paper

AN - SCOPUS:84858425299

SN - 9780819485854

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - 22nd Congress of the International Commission for Optics

PB - SPIE - International Society for Optical Engineering

T2 - Congress of the International Commission for Optics 2011

Y2 - 15 August 2011 through 19 August 2011

ER -

Rodríguez-Herrera OG, Lara D, Dainty C. Polarimetry-based far-field method for high-resolution optical microscopy. In 22nd Congress of the International Commission for Optics: Light for the Development of the World. SPIE - International Society for Optical Engineering. 2011. 80110V. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.902119

Polarimetry-based far-field method for high-resolution optical microscopy

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Keywords

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