TY - JOUR
T1 - Polarimetric measurement of non-depolarizing optical systems
AU - Ulloa-Peña, Efrén
AU - Muñoz-Flores, Luis
AU - Rodríguez-Herrera, Oscar G.
AU - Rosete-Aguilar, Martha
AU - Bruce, Neil C.
PY - 2023/11/1
Y1 - 2023/11/1
N2 - The use of polarization measurements has become more common in recent years, as it gives more information than pure intensity measurements. Polarimetric components such as fixed or variable retarders and polarizers must be included in optical systems to obtain the polarization parameters required, and in many cases the optical system also includes other components such as relay and/or imaging optical systems. In this work we present a simple and robust method for the polarimetric characterization of non-depolarizing polarization components and other optical elements in the system, which does not require a full polarimeter. Since there is no depolarization, we represent the components as pure retarders with diattenuation and find their parameters (transmittance for the polarization components, angle of orientation of the fast axis, and retardance), from which we can retrieve their Mueller matrix. Our results show that the proposed method is accurate when compared with results obtained with a Mueller matrix dual-rotating retarder polarimeter calibrated using the eigenvalue calibration method, considered in this work as the gold standard, and is comparatively easier than the latter to implement, particularly for imaging polarimeters.
AB - The use of polarization measurements has become more common in recent years, as it gives more information than pure intensity measurements. Polarimetric components such as fixed or variable retarders and polarizers must be included in optical systems to obtain the polarization parameters required, and in many cases the optical system also includes other components such as relay and/or imaging optical systems. In this work we present a simple and robust method for the polarimetric characterization of non-depolarizing polarization components and other optical elements in the system, which does not require a full polarimeter. Since there is no depolarization, we represent the components as pure retarders with diattenuation and find their parameters (transmittance for the polarization components, angle of orientation of the fast axis, and retardance), from which we can retrieve their Mueller matrix. Our results show that the proposed method is accurate when compared with results obtained with a Mueller matrix dual-rotating retarder polarimeter calibrated using the eigenvalue calibration method, considered in this work as the gold standard, and is comparatively easier than the latter to implement, particularly for imaging polarimeters.
UR - https://www.scopus.com/pages/publications/85178515322
U2 - 10.1364/AO.497824
DO - 10.1364/AO.497824
M3 - Article
C2 - 38037940
AN - SCOPUS:85178515322
SN - 1559-128X
VL - 62
SP - 8357
EP - 8365
JO - Applied Optics
JF - Applied Optics
IS - 31
ER -