TY - JOUR
T1 - Phase stability of zirconium oxide films during focused ion beam milling
AU - Baxter, Felicity
AU - Garner, Alistair
AU - Topping, Matthew
AU - Hulme, Helen
AU - Preuss, Michael
AU - Frankel, Philipp
PY - 2018/6
Y1 - 2018/6
N2 - Focused ion beam (FIB) is a widely used technique for preparation of electron transparent samples and so it is vital to understand the potential for introduction of FIB-induced microstructural artefacts. The bombardment of both Xe+ and Ga+ ions is observed to cause extensive monoclinic to tetragonal phase transformation in ZrO2 corrosion films, however, this effect is diminished with reduced energy and is not observed below 5 KeV. This study emphasises the importance of careful FIB sample preparation with a low energy cleaning step, and also gives insight into the stabilisation mechanism of the tetragonal phase during oxidation.
AB - Focused ion beam (FIB) is a widely used technique for preparation of electron transparent samples and so it is vital to understand the potential for introduction of FIB-induced microstructural artefacts. The bombardment of both Xe+ and Ga+ ions is observed to cause extensive monoclinic to tetragonal phase transformation in ZrO2 corrosion films, however, this effect is diminished with reduced energy and is not observed below 5 KeV. This study emphasises the importance of careful FIB sample preparation with a low energy cleaning step, and also gives insight into the stabilisation mechanism of the tetragonal phase during oxidation.
KW - Corrosion
KW - Electron backscatter diffraction (EBSD)
KW - Focused ion beam (FIB)
KW - Transmission electron microscopy (TEM)
KW - Zirconium oxide
UR - http://www.scopus.com/inward/record.url?scp=85044453904&partnerID=8YFLogxK
U2 - 10.1016/j.jnucmat.2018.03.037
DO - 10.1016/j.jnucmat.2018.03.037
M3 - Article
AN - SCOPUS:85044453904
SN - 0022-3115
VL - 504
SP - 176
EP - 180
JO - Journal of Nuclear Materials
JF - Journal of Nuclear Materials
ER -