Phase Retrieval X-ray Diffractometry in the Case of High- or low-Flux Radaition Source

Andrei Y U Nikulin, P Zaumseil

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	SPIE Conference Proceedings
Place of Publication	USA
Publisher	SPIE - International Society for Optical Engineering
Pages	268 - 278
Number of pages	11
ISBN (Print)	0-8194-3779-4
Publication status	Published - 2000
Event	Advances in Laboratory based X-ray Sources and Optics - San Diego USA, USA Duration: 1 Jan 2000 → …

Conference	Advances in Laboratory based X-ray Sources and Optics
City	USA
Period	1/01/00 → …

Cite this

@inproceedings{b458f6c024e84ea5968559e9544b08c1,

title = "Phase Retrieval X-ray Diffractometry in the Case of High- or low-Flux Radaition Source",

author = "Nikulin, {Andrei Y U} and P Zaumseil",

year = "2000",

language = "English",

isbn = "0-8194-3779-4",

pages = "268 -- 278",

booktitle = "SPIE Conference Proceedings",

publisher = "SPIE - International Society for Optical Engineering",

address = "United States of America",

note = "Advances in Laboratory based X-ray Sources and Optics ; Conference date: 01-01-2000",

}

TY - GEN

T1 - Phase Retrieval X-ray Diffractometry in the Case of High- or low-Flux Radaition Source

AU - Nikulin, Andrei Y U

AU - Zaumseil, P

PY - 2000

Y1 - 2000

M3 - Conference Paper

SN - 0-8194-3779-4

SP - 268

EP - 278

BT - SPIE Conference Proceedings

PB - SPIE - International Society for Optical Engineering

CY - USA

T2 - Advances in Laboratory based X-ray Sources and Optics

Y2 - 1 January 2000

ER -