Phase field simulation of ferroelectrics with cracks

X. F. Zhao, A. K. Soh

Research output: Chapter in Book/Report/Conference proceedingConference PaperOther

Abstract

By employing a dipole defect model, two-dimensional phase field simulations of domain switching in the crack tip vicinity of a crack embedded in a relaxor ferroelectric single crystal, which was subjected to mechanical loading and electric field, have been carried out. The interaction between the dipole defects and crack, the influence of the dipole defect concentration density on the switching process, and the coupling effect of mechanical stress and electric field on domain switching in the vicinity of the crack tip have been studied. Comparing the results obtained from relaxor ferroelectrics with those of normal ferroelectrics, the former showed that, due to the interaction between the dipole defects and crack, polarization switching in the vicinity of the crack tip was suppressed. Moreover, the coupling between applied mechanical stress and electric field can either promote or suppress domain switching in the vicinity of a crack.

Original languageEnglish
Title of host publicationFracture and Strength of Solids VII
PublisherTrans Tech Publications
Pages710-715
Number of pages6
ISBN (Print)9780878492107
DOIs
Publication statusPublished - 2011
Externally publishedYes
EventInternational Conference on Fracture and Strength of Solids (FEOFS) 2010 - Kuala Lumpur, Malaysia
Duration: 7 Jun 20109 Jun 2010
Conference number: 8th
https://www.scientific.net/KEM.462-463 (Proceedings)

Publication series

NameKey Engineering Materials
Volume462-463
ISSN (Print)1013-9826
ISSN (Electronic)1662-9795

Conference

ConferenceInternational Conference on Fracture and Strength of Solids (FEOFS) 2010
Abbreviated titleFEOFS 2010
Country/TerritoryMalaysia
CityKuala Lumpur
Period7/06/109/06/10
Internet address

Keywords

  • Crack
  • Domain switching
  • Normal ferroelectric
  • Phase field simulation
  • Relaxor ferroelectric

Cite this