Phase controlled SERS enhancement

Yuanhui Zheng, Lorenzo Rosa, Thibaut Thai, Soon Hock Ng, Saulius Juodkazis, Udo Bach

Research output: Contribution to journalArticleResearchpeer-review

Abstract

Surface-enhanced Raman spectroscopy (SERS) has attracted increasing interest for chemical and biochemical sensing. Several studies have shown that SERS intensities are significantly increased when an optical interference substrate composed of a dielectric spacer and a reflector is used as a supporting substrate. However, the origin of this additional enhancement has not been systematically studied. In this paper, high sensitivity SERS substrates composed of self-assembled core-satellite nanostructures and silica-coated silicon interference layers have been developed. Their SERS enhancement is shown to be a function of the thickness of silica spacer on a more reflective silicon substrate. Finite difference time domain modeling is presented to show that the SERS enhancement is due to a spacer contribution via a sign change of the reflection coefficients at the interfaces. The magnitude of the local-field enhancement is defined by the interference of light reflected from the silica-air and silica-silicon interfaces, which constructively added at the hot spots providing a possibility to maximize intensity in the nanogaps between the self-assembled nanoparticles by changing the thickness of silica layer. The core-satellite assemblies on a 135 nm silica-coated silicon substrate exhibit a SERS activity of approximately 13 times higher than the glass substrate.

Original languageEnglish
Article number744
Number of pages9
JournalScientific Reports
Volume9
Issue number1
DOIs
Publication statusPublished - 1 Dec 2019

Cite this

Zheng, Y., Rosa, L., Thai, T., Ng, S. H., Juodkazis, S., & Bach, U. (2019). Phase controlled SERS enhancement. Scientific Reports, 9(1), [744]. https://doi.org/10.1038/s41598-018-36491-0
Zheng, Yuanhui ; Rosa, Lorenzo ; Thai, Thibaut ; Ng, Soon Hock ; Juodkazis, Saulius ; Bach, Udo. / Phase controlled SERS enhancement. In: Scientific Reports. 2019 ; Vol. 9, No. 1.
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abstract = "Surface-enhanced Raman spectroscopy (SERS) has attracted increasing interest for chemical and biochemical sensing. Several studies have shown that SERS intensities are significantly increased when an optical interference substrate composed of a dielectric spacer and a reflector is used as a supporting substrate. However, the origin of this additional enhancement has not been systematically studied. In this paper, high sensitivity SERS substrates composed of self-assembled core-satellite nanostructures and silica-coated silicon interference layers have been developed. Their SERS enhancement is shown to be a function of the thickness of silica spacer on a more reflective silicon substrate. Finite difference time domain modeling is presented to show that the SERS enhancement is due to a spacer contribution via a sign change of the reflection coefficients at the interfaces. The magnitude of the local-field enhancement is defined by the interference of light reflected from the silica-air and silica-silicon interfaces, which constructively added at the hot spots providing a possibility to maximize intensity in the nanogaps between the self-assembled nanoparticles by changing the thickness of silica layer. The core-satellite assemblies on a 135 nm silica-coated silicon substrate exhibit a SERS activity of approximately 13 times higher than the glass substrate.",
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Zheng, Y, Rosa, L, Thai, T, Ng, SH, Juodkazis, S & Bach, U 2019, 'Phase controlled SERS enhancement', Scientific Reports, vol. 9, no. 1, 744. https://doi.org/10.1038/s41598-018-36491-0

Phase controlled SERS enhancement. / Zheng, Yuanhui; Rosa, Lorenzo; Thai, Thibaut; Ng, Soon Hock; Juodkazis, Saulius; Bach, Udo.

In: Scientific Reports, Vol. 9, No. 1, 744, 01.12.2019.

Research output: Contribution to journalArticleResearchpeer-review

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Zheng Y, Rosa L, Thai T, Ng SH, Juodkazis S, Bach U. Phase controlled SERS enhancement. Scientific Reports. 2019 Dec 1;9(1). 744. https://doi.org/10.1038/s41598-018-36491-0