@inproceedings{10c7675f29214a3aaefd1097350fd0ff,
title = "Phase-contrast X-ray projection microscopy for materials characterisation",
abstract = "We have developed a point-projection X-ray microscope based around an SEM host instrument which exploits both phase and absorption contrast imaging to provide information about a sample at resolutions down to 80nm. The resulting images can be analysed via phase retrieval methods to produce a density map of the object with a superior signal to noise ratio than that which could be obtained by absorption contrast alone. Further improvements in resolution can be obtained by applying deconvolution methods to the original images to remove the effect of the asymmetric X-ray source shape from the image. This form of microscopy is also well suited to tomography and examples are given of imaging and tomography of materials science samples.",
author = "Mayo, {S. C.} and Miller, {P. R.} and Wilkins, {S. W.} and Davis, {T. J.} and D. Gao and Gureyev, {T. E.} and D. Paganin and Parry, {D. J.} and A. Pogany and T. Robb and Stevenson, {A. W.}",
year = "2002",
month = dec,
day = "1",
language = "English",
volume = "26",
series = "Materials Forum",
pages = "15--19",
booktitle = "Proceedings",
note = "1st National Conference and Exhibition on Nanotechnology ; Conference date: 25-09-2002 Through 27-09-2002",
}