Phase-contrast tomography at the nanoscale using hard x rays

Marco Stampanoni, Rajmund Mokso, Federica Marone, Joan Vila-Comamala, Sergey Gorelick, Pavel Trtik, Konstantin Jefimovs, Christian David

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Synchrotron-based full-field tomographic microscopy established itself as a tool for noninvasive investigations. Many beamlines worldwide routinely achieve micrometer spatial resolution while the isotropic 100-nm barrier is reached and trespassed only by few instruments, mainly in the soft x-ray regime. We present an x-ray, full-field microscope with tomographic capabilities operating at 10 keV and with an isotropic resolution of 144 nm. Custom-designed optical components allow for ideal, aperture-matched sample illumination and very sensitive phase contrast imaging. We show here that the instrument has been successfully used for the nondestructive, volumetric investigation of single cells.

Original languageEnglish
Article number140105
JournalPhysical Review B
Issue number14
Publication statusPublished - 20 Apr 2010
Externally publishedYes

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