Phase and intensity control through diffractive optical elements in X-ray microscopy

Enzo Di Fabrizio; Danut Adrian Cojoc; Stefano Cabrini; Matteo Altissimo; Burkhard Kaulich; Thomas Wilhein; Jean Susini; Olivier Dhez

doi:10.1016/j.elspec.2005.01.262

Phase and intensity control through diffractive optical elements in X-ray microscopy

Enzo Di Fabrizio, Danut Adrian Cojoc, Stefano Cabrini, Matteo Altissimo, Burkhard Kaulich, Thomas Wilhein, Jean Susini, Olivier Dhez

Melbourne Centre for Nanofabrication

Research output: Contribution to journal › Article › Research › peer-review

4 Citations (Scopus)

Original language	English
Pages (from-to)	957 - 961
Number of pages	5
Journal	Journal of Electron Spectroscopy and Related Phenomena
Volume	144-147
DOIs	https://doi.org/10.1016/j.elspec.2005.01.262
Publication status	Published - 2005

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10.1016/j.elspec.2005.01.262

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@article{bcb9285679414871ac5a3f2d7ad91e4a,

title = "Phase and intensity control through diffractive optical elements in X-ray microscopy",

author = "{Di Fabrizio}, Enzo and Cojoc, {Danut Adrian} and Stefano Cabrini and Matteo Altissimo and Burkhard Kaulich and Thomas Wilhein and Jean Susini and Olivier Dhez",

year = "2005",

doi = "10.1016/j.elspec.2005.01.262",

language = "English",

volume = "144-147",

pages = "957 -- 961",

journal = "Journal of Electron Spectroscopy and Related Phenomena",

issn = "0368-2048",

publisher = "Elsevier BV",

}

TY - JOUR

T1 - Phase and intensity control through diffractive optical elements in X-ray microscopy

AU - Di Fabrizio, Enzo

AU - Cojoc, Danut Adrian

AU - Cabrini, Stefano

AU - Altissimo, Matteo

AU - Kaulich, Burkhard

AU - Wilhein, Thomas

AU - Susini, Jean

AU - Dhez, Olivier

PY - 2005

Y1 - 2005

UR - http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=pubmed&cmd=Retrieve&dopt=AbstractPlus&list_uids=7423273742971108408related:OPxGmCPEBGcJ

U2 - 10.1016/j.elspec.2005.01.262

DO - 10.1016/j.elspec.2005.01.262

M3 - Article

SN - 0368-2048

VL - 144-147

SP - 957

EP - 961

JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

ER -

Phase and intensity control through diffractive optical elements in X-ray microscopy

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