Phase and intensity control through diffractive optical elements in X-ray microscopy

Enzo Di Fabrizio, Danut Adrian Cojoc, Stefano Cabrini, Matteo Altissimo, Burkhard Kaulich, Thomas Wilhein, Jean Susini, Olivier Dhez

Research output: Contribution to journalArticleResearchpeer-review

4 Citations (Scopus)
Original languageEnglish
Pages (from-to)957 - 961
Number of pages5
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume144-147
DOIs
Publication statusPublished - 2005

Cite this

Di Fabrizio, E., Cojoc, D. A., Cabrini, S., Altissimo, M., Kaulich, B., Wilhein, T., ... Dhez, O. (2005). Phase and intensity control through diffractive optical elements in X-ray microscopy. Journal of Electron Spectroscopy and Related Phenomena, 144-147, 957 - 961. https://doi.org/10.1016/j.elspec.2005.01.262
Di Fabrizio, Enzo ; Cojoc, Danut Adrian ; Cabrini, Stefano ; Altissimo, Matteo ; Kaulich, Burkhard ; Wilhein, Thomas ; Susini, Jean ; Dhez, Olivier. / Phase and intensity control through diffractive optical elements in X-ray microscopy. In: Journal of Electron Spectroscopy and Related Phenomena. 2005 ; Vol. 144-147. pp. 957 - 961.
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title = "Phase and intensity control through diffractive optical elements in X-ray microscopy",
author = "{Di Fabrizio}, Enzo and Cojoc, {Danut Adrian} and Stefano Cabrini and Matteo Altissimo and Burkhard Kaulich and Thomas Wilhein and Jean Susini and Olivier Dhez",
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Di Fabrizio, E, Cojoc, DA, Cabrini, S, Altissimo, M, Kaulich, B, Wilhein, T, Susini, J & Dhez, O 2005, 'Phase and intensity control through diffractive optical elements in X-ray microscopy', Journal of Electron Spectroscopy and Related Phenomena, vol. 144-147, pp. 957 - 961. https://doi.org/10.1016/j.elspec.2005.01.262

Phase and intensity control through diffractive optical elements in X-ray microscopy. / Di Fabrizio, Enzo; Cojoc, Danut Adrian; Cabrini, Stefano; Altissimo, Matteo; Kaulich, Burkhard; Wilhein, Thomas; Susini, Jean; Dhez, Olivier.

In: Journal of Electron Spectroscopy and Related Phenomena, Vol. 144-147, 2005, p. 957 - 961.

Research output: Contribution to journalArticleResearchpeer-review

TY - JOUR

T1 - Phase and intensity control through diffractive optical elements in X-ray microscopy

AU - Di Fabrizio, Enzo

AU - Cojoc, Danut Adrian

AU - Cabrini, Stefano

AU - Altissimo, Matteo

AU - Kaulich, Burkhard

AU - Wilhein, Thomas

AU - Susini, Jean

AU - Dhez, Olivier

PY - 2005

Y1 - 2005

UR - http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=pubmed&cmd=Retrieve&dopt=AbstractPlus&list_uids=7423273742971108408related:OPxGmCPEBGcJ

U2 - 10.1016/j.elspec.2005.01.262

DO - 10.1016/j.elspec.2005.01.262

M3 - Article

VL - 144-147

SP - 957

EP - 961

JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

SN - 0368-2048

ER -