Periodic piecewise linear excitation for ADC testing

Tat Chern Ong, Min Tong Tee, Ye Chow Kuang, Melanie Po-Leen Ooi, Serge Demidenko

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    1 Citation (Scopus)
    Original languageEnglish
    Title of host publication2012 IEEE International Instrument and Mesurement Technology Conference Proceedings (I2MTC 2012)
    EditorsAnton Fuchs, Annamaria Varkonyi-Koczy, Daniel Watzenig
    Place of PublicationNew York NY USA
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages2285 - 2290
    Number of pages6
    ISBN (Print)9781457717734
    DOIs
    Publication statusPublished - 2012
    EventIEEE International Instrumentation and Measurement Technology Conference 2012 - Austria, New York NY USA
    Duration: 1 Jan 2012 → …

    Conference

    ConferenceIEEE International Instrumentation and Measurement Technology Conference 2012
    Abbreviated titleI2MTC 2012
    CityNew York NY USA
    Period1/01/12 → …

    Cite this

    Ong, T. C., Tee, M. T., Kuang, Y. C., Ooi, M. P-L., & Demidenko, S. (2012). Periodic piecewise linear excitation for ADC testing. In A. Fuchs, A. Varkonyi-Koczy, & D. Watzenig (Eds.), 2012 IEEE International Instrument and Mesurement Technology Conference Proceedings (I2MTC 2012) (pp. 2285 - 2290). New York NY USA: IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/I2MTC.2012.6229680
    Ong, Tat Chern ; Tee, Min Tong ; Kuang, Ye Chow ; Ooi, Melanie Po-Leen ; Demidenko, Serge. / Periodic piecewise linear excitation for ADC testing. 2012 IEEE International Instrument and Mesurement Technology Conference Proceedings (I2MTC 2012). editor / Anton Fuchs ; Annamaria Varkonyi-Koczy ; Daniel Watzenig. New York NY USA : IEEE, Institute of Electrical and Electronics Engineers, 2012. pp. 2285 - 2290
    @inproceedings{157d31c904ed44ff9467f800230cab8f,
    title = "Periodic piecewise linear excitation for ADC testing",
    author = "Ong, {Tat Chern} and Tee, {Min Tong} and Kuang, {Ye Chow} and Ooi, {Melanie Po-Leen} and Serge Demidenko",
    year = "2012",
    doi = "10.1109/I2MTC.2012.6229680",
    language = "English",
    isbn = "9781457717734",
    pages = "2285 -- 2290",
    editor = "Anton Fuchs and Annamaria Varkonyi-Koczy and Daniel Watzenig",
    booktitle = "2012 IEEE International Instrument and Mesurement Technology Conference Proceedings (I2MTC 2012)",
    publisher = "IEEE, Institute of Electrical and Electronics Engineers",
    address = "United States of America",

    }

    Ong, TC, Tee, MT, Kuang, YC, Ooi, MP-L & Demidenko, S 2012, Periodic piecewise linear excitation for ADC testing. in A Fuchs, A Varkonyi-Koczy & D Watzenig (eds), 2012 IEEE International Instrument and Mesurement Technology Conference Proceedings (I2MTC 2012). IEEE, Institute of Electrical and Electronics Engineers, New York NY USA, pp. 2285 - 2290, IEEE International Instrumentation and Measurement Technology Conference 2012, New York NY USA, 1/01/12. https://doi.org/10.1109/I2MTC.2012.6229680

    Periodic piecewise linear excitation for ADC testing. / Ong, Tat Chern; Tee, Min Tong; Kuang, Ye Chow; Ooi, Melanie Po-Leen; Demidenko, Serge.

    2012 IEEE International Instrument and Mesurement Technology Conference Proceedings (I2MTC 2012). ed. / Anton Fuchs; Annamaria Varkonyi-Koczy; Daniel Watzenig. New York NY USA : IEEE, Institute of Electrical and Electronics Engineers, 2012. p. 2285 - 2290.

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    TY - GEN

    T1 - Periodic piecewise linear excitation for ADC testing

    AU - Ong, Tat Chern

    AU - Tee, Min Tong

    AU - Kuang, Ye Chow

    AU - Ooi, Melanie Po-Leen

    AU - Demidenko, Serge

    PY - 2012

    Y1 - 2012

    UR - http://dx.doi.org/10.1109/I2MTC.2012.6229680

    U2 - 10.1109/I2MTC.2012.6229680

    DO - 10.1109/I2MTC.2012.6229680

    M3 - Conference Paper

    SN - 9781457717734

    SP - 2285

    EP - 2290

    BT - 2012 IEEE International Instrument and Mesurement Technology Conference Proceedings (I2MTC 2012)

    A2 - Fuchs, Anton

    A2 - Varkonyi-Koczy, Annamaria

    A2 - Watzenig, Daniel

    PB - IEEE, Institute of Electrical and Electronics Engineers

    CY - New York NY USA

    ER -

    Ong TC, Tee MT, Kuang YC, Ooi MP-L, Demidenko S. Periodic piecewise linear excitation for ADC testing. In Fuchs A, Varkonyi-Koczy A, Watzenig D, editors, 2012 IEEE International Instrument and Mesurement Technology Conference Proceedings (I2MTC 2012). New York NY USA: IEEE, Institute of Electrical and Electronics Engineers. 2012. p. 2285 - 2290 https://doi.org/10.1109/I2MTC.2012.6229680