Perimeter recombination characterization by luminescence imaging

Kean Chern Fong; Milan Padilla; Andreas Fell; Evan Franklin; Keith R McIntosh; Teng Choon Kho; Andrew Blakers; Yona Jadwiga Nebel-Jacobsen; Sachin R Surve

doi:10.1109/JPHOTOV.2015.2480225

Perimeter recombination characterization by luminescence imaging

Kean Chern Fong, Milan Padilla, Andreas Fell, Evan Franklin, Keith R McIntosh, Teng Choon Kho, Andrew Blakers, Yona Jadwiga Nebel-Jacobsen, Sachin R Surve

Research output: Contribution to journal › Article › Research › peer-review

15 Citations (Scopus)

Abstract

Perimeter recombination causes significant efficiency loss in solar cells. This paper presents a method to quantify perimeter recombination via luminescence imaging for silicon solar cells embedded within the wafer. The validity of the method is discussed and verified via 2-D semiconductor simulation. We demonstrate the method to be sufficiently sensitive in that it can quantify perimeter recombination even in a solar cell where no obvious deviation from ideality is observed in the current-voltage (J-V) curve.

Original language	English
Pages (from-to)	244-251
Number of pages	8
Journal	IEEE Journal of Photovoltaics
Volume	6
Issue number	1
DOIs	https://doi.org/10.1109/JPHOTOV.2015.2480225
Publication status	Published - Jan 2016
Externally published	Yes

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10.1109/JPHOTOV.2015.2480225

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title = "Perimeter recombination characterization by luminescence imaging",

abstract = "Perimeter recombination causes significant efficiency loss in solar cells. This paper presents a method to quantify perimeter recombination via luminescence imaging for silicon solar cells embedded within the wafer. The validity of the method is discussed and verified via 2-D semiconductor simulation. We demonstrate the method to be sufficiently sensitive in that it can quantify perimeter recombination even in a solar cell where no obvious deviation from ideality is observed in the current-voltage (J-V) curve.",

author = "Fong, \{Kean Chern\} and Milan Padilla and Andreas Fell and Evan Franklin and McIntosh, \{Keith R\} and Kho, \{Teng Choon\} and Andrew Blakers and Nebel-Jacobsen, \{Yona Jadwiga\} and Surve, \{Sachin R\}",

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AU - Fong, Kean Chern

AU - Padilla, Milan

AU - Fell, Andreas

AU - Franklin, Evan

AU - McIntosh, Keith R

AU - Kho, Teng Choon

AU - Blakers, Andrew

AU - Nebel-Jacobsen, Yona Jadwiga

AU - Surve, Sachin R

PY - 2016/1

Y1 - 2016/1

N2 - Perimeter recombination causes significant efficiency loss in solar cells. This paper presents a method to quantify perimeter recombination via luminescence imaging for silicon solar cells embedded within the wafer. The validity of the method is discussed and verified via 2-D semiconductor simulation. We demonstrate the method to be sufficiently sensitive in that it can quantify perimeter recombination even in a solar cell where no obvious deviation from ideality is observed in the current-voltage (J-V) curve.

AB - Perimeter recombination causes significant efficiency loss in solar cells. This paper presents a method to quantify perimeter recombination via luminescence imaging for silicon solar cells embedded within the wafer. The validity of the method is discussed and verified via 2-D semiconductor simulation. We demonstrate the method to be sufficiently sensitive in that it can quantify perimeter recombination even in a solar cell where no obvious deviation from ideality is observed in the current-voltage (J-V) curve.

UR - http://ieeexplore.ieee.org.ezproxy.lib.monash.edu.au/stamp/stamp.jsp?tp=&arnumber=7293584

U2 - 10.1109/JPHOTOV.2015.2480225

DO - 10.1109/JPHOTOV.2015.2480225

M3 - Article

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VL - 6

SP - 244

EP - 251

JO - IEEE Journal of Photovoltaics

JF - IEEE Journal of Photovoltaics

IS - 1

ER -

Perimeter recombination characterization by luminescence imaging

Abstract

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