Performance of charge-coupled devices in digital shearography

Tuck Wah Ng, Fook S. Chau

Research output: Chapter in Book/Report/Conference proceedingConference PaperOther

1 Citation (Scopus)

Abstract

The use of charge-coupled devices (CCDs) for imaging in digital shearography necessitates the knowledge of their electronic (signal-independent) noise level, as the visibility of fringes produced is dependent on this factor. A method based on measuring the experimental CCD noise variance to construct a linear equation system is presented. From the solution of this equation system, the electronic noise level of a particular CCD used for imaging can be determined. Evaluation of CCDs based on this noise factor allows the performance of each CCD used in digital shearography to be compared.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsKevin G. Harding
PublisherSPIE
Pages14-19
Number of pages6
ISBN (Print)0819413313
Publication statusPublished - 1 Dec 1993
Externally publishedYes
EventIndustrial Optical Sensing and Metrology: Applications and Integration - Boston, United States of America
Duration: 10 Sep 199310 Sep 1993

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2066
ISSN (Print)0277-786X

Conference

ConferenceIndustrial Optical Sensing and Metrology: Applications and Integration
CountryUnited States of America
CityBoston
Period10/09/9310/09/93

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