Performance comparison of various multisine excitation signals in ADC testing

Poon Shern Liam; Ye Chow Kuang; Melanie Po-Leen Ooi; Meng Sang Ong; J C C Yeoh

doi:10.1109/DELTA.2011.30

Performance comparison of various multisine excitation signals in ADC testing

Poon Shern Liam, Ye Chow Kuang, Melanie Po-Leen Ooi, Meng Sang Ong, J C C Yeoh

Malaysia School of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

5 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of the 2011 Sixth IEEE International Symposium on Electronic Design, Test and Application, DELTA 2011
Editors	Gourab Sen Gupta, Donald Bailey, Serge Demidenko, Adam Osseiran, Michel Renovell
Place of Publication	USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	122 - 127
Number of pages	6
ISBN (Print)	97870769543062
DOIs	https://doi.org/10.1109/DELTA.2011.30
Publication status	Published - 2011
Event	IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2011 - Queenstown, New Zealand Duration: 17 Jan 2011 → 19 Jan 2011 Conference number: 6th https://ieeexplore.ieee.org/xpl/conhome/5729429/proceeding (Proceedings)

Conference

Conference	IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2011
Abbreviated title	DELTA 2011
Country/Territory	New Zealand
City	Queenstown
Period	17/01/11 → 19/01/11
Internet address	https://ieeexplore.ieee.org/xpl/conhome/5729429/proceeding (Proceedings)

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10.1109/DELTA.2011.30

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Liam, P. S., Kuang, Y. C., Ooi, M. P.-L., Ong, M. S., & Yeoh, J. C. C. (2011). Performance comparison of various multisine excitation signals in ADC testing. In G. Sen Gupta, D. Bailey, S. Demidenko, A. Osseiran, & M. Renovell (Eds.), Proceedings of the 2011 Sixth IEEE International Symposium on Electronic Design, Test and Application, DELTA 2011 (pp. 122 - 127). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/DELTA.2011.30

Liam, Poon Shern ; Kuang, Ye Chow ; Ooi, Melanie Po-Leen et al. / Performance comparison of various multisine excitation signals in ADC testing. Proceedings of the 2011 Sixth IEEE International Symposium on Electronic Design, Test and Application, DELTA 2011. editor / Gourab Sen Gupta ; Donald Bailey ; Serge Demidenko ; Adam Osseiran ; Michel Renovell. USA : IEEE, Institute of Electrical and Electronics Engineers, 2011. pp. 122 - 127

@inproceedings{2a49249122014952a3105ddd4d736ec2,

title = "Performance comparison of various multisine excitation signals in ADC testing",

author = "Liam, \{Poon Shern\} and Kuang, \{Ye Chow\} and Ooi, \{Melanie Po-Leen\} and Ong, \{Meng Sang\} and Yeoh, \{J C C\}",

year = "2011",

doi = "10.1109/DELTA.2011.30",

language = "English",

isbn = "97870769543062",

pages = "122 -- 127",

editor = "\{Sen Gupta\}, Gourab and Donald Bailey and Serge Demidenko and Adam Osseiran and Michel Renovell",

booktitle = "Proceedings of the 2011 Sixth IEEE International Symposium on Electronic Design, Test and Application, DELTA 2011",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2011, DELTA 2011 ; Conference date: 17-01-2011 Through 19-01-2011",

url = "https://ieeexplore.ieee.org/xpl/conhome/5729429/proceeding",

}

Liam, PS, Kuang, YC, Ooi, MP-L, Ong, MS & Yeoh, JCC 2011, Performance comparison of various multisine excitation signals in ADC testing. in G Sen Gupta, D Bailey, S Demidenko, A Osseiran & M Renovell (eds), Proceedings of the 2011 Sixth IEEE International Symposium on Electronic Design, Test and Application, DELTA 2011. IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 122 - 127, IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2011, Queenstown, New Zealand, 17/01/11. https://doi.org/10.1109/DELTA.2011.30

Performance comparison of various multisine excitation signals in ADC testing. / Liam, Poon Shern; Kuang, Ye Chow; Ooi, Melanie Po-Leen et al.
Proceedings of the 2011 Sixth IEEE International Symposium on Electronic Design, Test and Application, DELTA 2011. ed. / Gourab Sen Gupta; Donald Bailey; Serge Demidenko; Adam Osseiran; Michel Renovell. USA: IEEE, Institute of Electrical and Electronics Engineers, 2011. p. 122 - 127.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Performance comparison of various multisine excitation signals in ADC testing

AU - Liam, Poon Shern

AU - Kuang, Ye Chow

AU - Ooi, Melanie Po-Leen

AU - Ong, Meng Sang

AU - Yeoh, J C C

N1 - Conference code: 6th

PY - 2011

Y1 - 2011

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UR - https://www.scopus.com/pages/publications/79953158030

U2 - 10.1109/DELTA.2011.30

DO - 10.1109/DELTA.2011.30

M3 - Conference Paper

SN - 97870769543062

SP - 122

EP - 127

BT - Proceedings of the 2011 Sixth IEEE International Symposium on Electronic Design, Test and Application, DELTA 2011

A2 - Sen Gupta, Gourab

A2 - Bailey, Donald

A2 - Demidenko, Serge

A2 - Osseiran, Adam

A2 - Renovell, Michel

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - USA

T2 - IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2011

Y2 - 17 January 2011 through 19 January 2011

ER -

Liam PS, Kuang YC, Ooi MPL, Ong MS, Yeoh JCC. Performance comparison of various multisine excitation signals in ADC testing. In Sen Gupta G, Bailey D, Demidenko S, Osseiran A, Renovell M, editors, Proceedings of the 2011 Sixth IEEE International Symposium on Electronic Design, Test and Application, DELTA 2011. USA: IEEE, Institute of Electrical and Electronics Engineers. 2011. p. 122 - 127 doi: 10.1109/DELTA.2011.30

Performance comparison of various multisine excitation signals in ADC testing

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