Path-oriented test data generation driven by component linear fitting functions

Wenxu Ding; Xin Chen; Peng Jiang; Nan Ye; Lei Bu; Xuandong Li

doi:10.1109/SERE-C.2012.40

Path-oriented test data generation driven by component linear fitting functions

Wenxu Ding, Xin Chen, Peng Jiang, Nan Ye, Lei Bu, Xuandong Li

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Abstract

Automatically generating test data to cover a given path is a challenging problem. This paper present a program execution based approach driven by component linear fitting functions. Here, component linear fitting functions built on inputs and values at decision points, are used to approximate constraints. They drive the search to reach constraints' solutions by calculating feasible intervals. Experiments show that the approach is effective and has good potentiality in treating nonlinear constraints and constraints with many local optimal points.

Original language	English
Title of host publication	Proceedings of the 2012 IEEE 6th International Conference on Software Security and Reliability Companion, SERE-C 2012
Place of Publication	Piscataway NJ USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	37-38
Number of pages	2
ISBN (Print)	9780769547435
DOIs	https://doi.org/10.1109/SERE-C.2012.40
Publication status	Published - 2012
Externally published	Yes
Event	IEEE International Conference on Software Security and Reliability Companion (SERE 2012) - National Institute of Standards and Technology (NIST), Gaithersburg, United States of America Duration: 20 Jun 2012 → 22 Jun 2012 Conference number: 6th http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6257543 http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6258481

Conference

Conference	IEEE International Conference on Software Security and Reliability Companion (SERE 2012)
Abbreviated title	SERE 2012
Country/Territory	United States of America
City	Gaithersburg
Period	20/06/12 → 22/06/12
Internet address	http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6257543 http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6258481

Keywords

Component linear fitting function
Search based approach
Test case generation

Access to Document

10.1109/SERE-C.2012.40

Cite this

Ding, W., Chen, X., Jiang, P., Ye, N., Bu, L., & Li, X. (2012). Path-oriented test data generation driven by component linear fitting functions. In Proceedings of the 2012 IEEE 6th International Conference on Software Security and Reliability Companion, SERE-C 2012 (pp. 37-38). [6258445] IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/SERE-C.2012.40

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author = "Wenxu Ding and Xin Chen and Peng Jiang and Nan Ye and Lei Bu and Xuandong Li",

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address = "United States of America",

note = "IEEE International Conference on Software Security and Reliability Companion (SERE 2012), SERE 2012 ; Conference date: 20-06-2012 Through 22-06-2012",

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Ding, W, Chen, X, Jiang, P, Ye, N, Bu, L & Li, X 2012, Path-oriented test data generation driven by component linear fitting functions. in Proceedings of the 2012 IEEE 6th International Conference on Software Security and Reliability Companion, SERE-C 2012., 6258445, IEEE, Institute of Electrical and Electronics Engineers, Piscataway NJ USA, pp. 37-38, IEEE International Conference on Software Security and Reliability Companion (SERE 2012), Gaithersburg, Maryland, United States of America, 20/06/12. https://doi.org/10.1109/SERE-C.2012.40

Path-oriented test data generation driven by component linear fitting functions. / Ding, Wenxu; Chen, Xin; Jiang, Peng; Ye, Nan; Bu, Lei; Li, Xuandong.

Proceedings of the 2012 IEEE 6th International Conference on Software Security and Reliability Companion, SERE-C 2012. Piscataway NJ USA : IEEE, Institute of Electrical and Electronics Engineers, 2012. p. 37-38 6258445.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

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Ding W, Chen X, Jiang P, Ye N, Bu L, Li X. Path-oriented test data generation driven by component linear fitting functions. In Proceedings of the 2012 IEEE 6th International Conference on Software Security and Reliability Companion, SERE-C 2012. Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers. 2012. p. 37-38. 6258445 https://doi.org/10.1109/SERE-C.2012.40

Path-oriented test data generation driven by component linear fitting functions

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Keywords

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