Original language | English |
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Title of host publication | Proceedings of the 2010 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems |
Editors | Paul Barford, Mark S Squillante |
Place of Publication | New York NY USA |
Publisher | Association for Computing Machinery (ACM) |
Pages | 37 - 48 |
Number of pages | 12 |
Volume | 38 |
ISBN (Print) | 9781450302111 |
DOIs | |
Publication status | Published - 2010 |
Externally published | Yes |
Event | ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems 2010 - New York, United States of America Duration: 14 Jun 2010 → 18 Jun 2010 https://www.sigmetrics.org/sigmetrics2010/ (Conference website) https://dl.acm.org/doi/proceedings/10.1145/1811039 |
Conference
Conference | ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems 2010 |
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Abbreviated title | SIGMETRICS 2010 |
Country/Territory | United States of America |
City | New York |
Period | 14/06/10 → 18/06/10 |
Internet address |