On the use of conductance and differential conductivity in TEM parasections (CDI)

Michael W. Asten

On the use of conductance and differential conductivity in TEM parasections (CDI)

Michael W. Asten

School of Earth Atmosphere and Environment

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Other › peer-review

3 Citations (Scopus)

Abstract

The SPIKER algorithm for computing conductivty-depth images (parasections) from profiles of in-loop time-domain EM data can be extended to provide differential conductivity vs depth, and integrated conductance vs depth. Where a conductive overburden partially conceals a basement conductor by providing a background response comparable with that of the basement conductor, these extensions to the SPIKER algorithm give improved images of basement conductors.

Original language	English
Title of host publication	Proceedings
Publication status	Published - 1 Jan 1998
Event	Society of Exploration Geophysicists Annual Meeting 1998 - New Orleans, United States of America Duration: 13 Sept 1998 → 18 Sept 1998

Conference

Conference	Society of Exploration Geophysicists Annual Meeting 1998
Abbreviated title	SEG 1998
Country/Territory	United States of America
City	New Orleans
Period	13/09/98 → 18/09/98

Cite this

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title = "On the use of conductance and differential conductivity in TEM parasections (CDI)",

abstract = "The SPIKER algorithm for computing conductivty-depth images (parasections) from profiles of in-loop time-domain EM data can be extended to provide differential conductivity vs depth, and integrated conductance vs depth. Where a conductive overburden partially conceals a basement conductor by providing a background response comparable with that of the basement conductor, these extensions to the SPIKER algorithm give improved images of basement conductors.",

author = "Asten, \{Michael W.\}",

year = "1998",

month = jan,

day = "1",

language = "English",

booktitle = "Proceedings",

note = "Society of Exploration Geophysicists Annual Meeting 1998, SEG 1998 ; Conference date: 13-09-1998 Through 18-09-1998",

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T1 - On the use of conductance and differential conductivity in TEM parasections (CDI)

AU - Asten, Michael W.

PY - 1998/1/1

Y1 - 1998/1/1

N2 - The SPIKER algorithm for computing conductivty-depth images (parasections) from profiles of in-loop time-domain EM data can be extended to provide differential conductivity vs depth, and integrated conductance vs depth. Where a conductive overburden partially conceals a basement conductor by providing a background response comparable with that of the basement conductor, these extensions to the SPIKER algorithm give improved images of basement conductors.

AB - The SPIKER algorithm for computing conductivty-depth images (parasections) from profiles of in-loop time-domain EM data can be extended to provide differential conductivity vs depth, and integrated conductance vs depth. Where a conductive overburden partially conceals a basement conductor by providing a background response comparable with that of the basement conductor, these extensions to the SPIKER algorithm give improved images of basement conductors.

UR - https://www.scopus.com/pages/publications/85009358538

M3 - Conference Paper

AN - SCOPUS:85009358538

BT - Proceedings

T2 - Society of Exploration Geophysicists Annual Meeting 1998

Y2 - 13 September 1998 through 18 September 1998

ER -

On the use of conductance and differential conductivity in TEM parasections (CDI)

Abstract

Conference

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Cite this