On the use of conductance and differential conductivity in TEM parasections (CDI)

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Abstract

The SPIKER algorithm for computing conductivty-depth images (parasections) from profiles of in-loop time-domain EM data can be extended to provide differential conductivity vs depth, and integrated conductance vs depth. Where a conductive overburden partially conceals a basement conductor by providing a background response comparable with that of the basement conductor, these extensions to the SPIKER algorithm give improved images of basement conductors.

Original languageEnglish
Title of host publicationProceedings
Publication statusPublished - 1 Jan 1998
Event1998 Society of Exploration Geophysicists Annual Meeting, SEG 1998 - New Orleans, United States of America
Duration: 13 Sep 199818 Sep 1998

Conference

Conference1998 Society of Exploration Geophysicists Annual Meeting, SEG 1998
CountryUnited States of America
CityNew Orleans
Period13/09/9818/09/98

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