On the use of conductance and differential conductivity in TEM parasections (CDI)

Michael W. Asten

On the use of conductance and differential conductivity in TEM parasections (CDI)

Michael W. Asten

School of Earth Atmosphere and Environment

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Other › peer-review

2 Citations (Scopus)

Abstract

The SPIKER algorithm for computing conductivty-depth images (parasections) from profiles of in-loop time-domain EM data can be extended to provide differential conductivity vs depth, and integrated conductance vs depth. Where a conductive overburden partially conceals a basement conductor by providing a background response comparable with that of the basement conductor, these extensions to the SPIKER algorithm give improved images of basement conductors.

Original language	English
Title of host publication	Proceedings
Publication status	Published - 1 Jan 1998
Event	1998 Society of Exploration Geophysicists Annual Meeting, SEG 1998 - New Orleans, United States of America Duration: 13 Sep 1998 → 18 Sep 1998

Conference

Conference	1998 Society of Exploration Geophysicists Annual Meeting, SEG 1998
Country	United States of America
City	New Orleans
Period	13/09/98 → 18/09/98

Access to Document

Link to publication in Scopus

Cite this

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title = "On the use of conductance and differential conductivity in TEM parasections (CDI)",

abstract = "The SPIKER algorithm for computing conductivty-depth images (parasections) from profiles of in-loop time-domain EM data can be extended to provide differential conductivity vs depth, and integrated conductance vs depth. Where a conductive overburden partially conceals a basement conductor by providing a background response comparable with that of the basement conductor, these extensions to the SPIKER algorithm give improved images of basement conductors.",

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year = "1998",

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AB - The SPIKER algorithm for computing conductivty-depth images (parasections) from profiles of in-loop time-domain EM data can be extended to provide differential conductivity vs depth, and integrated conductance vs depth. Where a conductive overburden partially conceals a basement conductor by providing a background response comparable with that of the basement conductor, these extensions to the SPIKER algorithm give improved images of basement conductors.

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AN - SCOPUS:85009358538

BT - Proceedings

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Y2 - 13 September 1998 through 18 September 1998

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