On the limits of High Angle Annular Dark Field (HAADF) tomography; electron beam damage

Research output: Contribution to journal › Meeting Abstract › peer-review

Original language	English
Pages (from-to)	20-21
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	11
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927605507645
Publication status	Published - 25 Aug 2005
Externally published	Yes

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title = "On the limits of High Angle Annular Dark Field (HAADF) tomography; electron beam damage",

author = "M. Weyland",

year = "2005",

month = aug,

day = "25",

doi = "10.1017/S1431927605507645",

language = "English",

volume = "11",

pages = "20--21",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "SUPPL. 2",

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AU - Weyland, M.

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