On the limits of High Angle Annular Dark Field (HAADF) tomography; electron beam damage

Research output: Contribution to journalArticleOtherpeer-review

3 Citations (Scopus)
Original languageEnglish
Pages (from-to)20-21
Number of pages2
JournalMicroscopy and Microanalysis
Volume11
Issue numberSUPPL. 2
DOIs
Publication statusPublished - 25 Aug 2005
Externally publishedYes

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