On the improvement of a fault classification scheme with implications for white-box testing

Shimul Kumar Nath, Robert Graham Merkel, Man Fai Lau

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    3 Citations (Scopus)
    Original languageEnglish
    Title of host publicationProceedings of the 27th Annual ACM Symposium on Applied Computing
    EditorsDongwan Shin
    Place of PublicationNew York NY USA
    PublisherAssociation for Computing Machinery (ACM)
    Pages1123 - 1130
    Number of pages8
    ISBN (Print)9781450308571
    DOIs
    Publication statusPublished - 2012
    EventACM Symposium on Applied Computing 2012 - Riva del Garda Congress Center, Trento, Italy
    Duration: 26 Mar 201230 Mar 2012
    Conference number: 27
    http://www.sigapp.org/sac/sac2012/

    Conference

    ConferenceACM Symposium on Applied Computing 2012
    Abbreviated titleSAC 2012
    CountryItaly
    CityTrento
    Period26/03/1230/03/12
    Internet address

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