On the importance of fifth-order spherical aberration for a fully corrected electron microscope

Lan-Yun Chang, Angus I Kirkland, John M Titchmarsh

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@article{34b24e765bd64e88af6065c50a41c684,

title = "On the importance of fifth-order spherical aberration for a fully corrected electron microscope",

author = "Lan-Yun Chang and Kirkland, \{Angus I\} and Titchmarsh, \{John M\}",

year = "2006",

doi = "10.1016/j.ultramic.2005.09.004",

language = "English",

volume = "106",

pages = "301 -- 306",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier BV",

number = "4-5",

}

TY - JOUR

T1 - On the importance of fifth-order spherical aberration for a fully corrected electron microscope

AU - Chang, Lan-Yun

AU - Kirkland, Angus I

AU - Titchmarsh, John M

PY - 2006

Y1 - 2006

UR - http://www.sciencedirect.com.ezproxy.lib.monash.edu.au/science/article/pii/S0304399105002160

UR - https://www.scopus.com/pages/publications/33344454528

U2 - 10.1016/j.ultramic.2005.09.004

DO - 10.1016/j.ultramic.2005.09.004

M3 - Article

SN - 0304-3991

VL - 106

SP - 301

EP - 306

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 4-5

ER -