On the growth of cracks from etch pits and the scatter associated with them under a miniTWIST spectrum

D. Tamboli, S. Barter, R. Jones

Research output: Contribution to journalArticleResearchpeer-review

18 Citations (Scopus)

Abstract

This paper examines the growth of cracks from small naturally occurring discontinuities in AA7050-T7451 coupons tested under a miniTWIST load spectrum. A markerband is inserted in the spectrum to aid in Quantitative Fractography. The resulting crack growth curve is reasonably exponential in nature, which indicates that crack growth under combat aircraft spectra and civil aircraft transport spectra is similar. It is also shown that the Hartman-Schijve crack growth equation can be used to compute the crack growth histories and account for the scatter seen in the various tests by allowing for small changes in the value of ΔKthr.

Original languageEnglish
Pages (from-to)10-16
Number of pages7
JournalInternational Journal of Fatigue
Volume109
DOIs
Publication statusPublished - 1 Apr 2018

Keywords

  • Aircraft sustainment
  • Etch pits
  • Fatigue crack growth
  • Fatigue variability
  • Lead cracks

Cite this