On the deposition of thin TiO2 films from Langmuir Blodgett film precursors. An electron spectroscopy study

Murali Sastry, Sipra Pal, D. V. Paranjape, P. Ganguly

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X-Ray photoemission and reflection electron energy loss spectroscopies have been used to characterize ultrathin TiO2 films obtained by thermal decomposition of Langmuir Blodgett films of n-octadecyl amine which were used to pick up titanyl oxalate ions from the aqueous subphase. The dielectric function of the film was obtained by a Kramers-Krönig analysis of the electron energy loss spectra, which show features characteristic of TiO2. A detailed Tougaard analysis of the photoemission core level background signal was performed to obtain the composition depth profile of the various elements and make an estimate of the film thickness.

Original languageEnglish
Pages (from-to)163-172
Number of pages10
JournalJournal of Electron Spectroscopy and Related Phenomena
Issue number1
Publication statusPublished - 18 Mar 1994
Externally publishedYes

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