On the automatic establishment of security relations for devices

Nicolai Kuntze, Carsten Rudolph

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

8 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 13th IFIP/IEEE International Symposium on Integrated Network Management (IM 2013)
EditorsFilip De Turck, Yixin Diao, Choong Seon Hong
Place of PublicationNew York NY USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages832 - 835
Number of pages4
Volume2013
ISBN (Print)9783901882517
Publication statusPublished - 2013
Externally publishedYes
EventIFIP/IEEE International Symposium on Integrated Network Management (IM) 2013 - Ghent University, Ghent, Belgium
Duration: 27 May 201331 May 2013
Conference number: 13th
https://www.ieee.org/conferences_events/conferences/conferencedetails/index.htm?Conf_ID=19921

Conference

ConferenceIFIP/IEEE International Symposium on Integrated Network Management (IM) 2013
Abbreviated titleIM 2013
CountryBelgium
CityGhent
Period27/05/1331/05/13
Internet address

Cite this

Kuntze, N., & Rudolph, C. (2013). On the automatic establishment of security relations for devices. In F. De Turck, Y. Diao, & C. S. Hong (Eds.), Proceedings of the 13th IFIP/IEEE International Symposium on Integrated Network Management (IM 2013) (Vol. 2013, pp. 832 - 835). New York NY USA: IEEE, Institute of Electrical and Electronics Engineers.
Kuntze, Nicolai ; Rudolph, Carsten. / On the automatic establishment of security relations for devices. Proceedings of the 13th IFIP/IEEE International Symposium on Integrated Network Management (IM 2013). editor / Filip De Turck ; Yixin Diao ; Choong Seon Hong. Vol. 2013 New York NY USA : IEEE, Institute of Electrical and Electronics Engineers, 2013. pp. 832 - 835
@inproceedings{033776943d7f43d98ce097bbc282bf6f,
title = "On the automatic establishment of security relations for devices",
author = "Nicolai Kuntze and Carsten Rudolph",
year = "2013",
language = "English",
isbn = "9783901882517",
volume = "2013",
pages = "832 -- 835",
editor = "{De Turck}, Filip and Yixin Diao and Hong, {Choong Seon}",
booktitle = "Proceedings of the 13th IFIP/IEEE International Symposium on Integrated Network Management (IM 2013)",
publisher = "IEEE, Institute of Electrical and Electronics Engineers",
address = "United States of America",

}

Kuntze, N & Rudolph, C 2013, On the automatic establishment of security relations for devices. in F De Turck, Y Diao & CS Hong (eds), Proceedings of the 13th IFIP/IEEE International Symposium on Integrated Network Management (IM 2013). vol. 2013, IEEE, Institute of Electrical and Electronics Engineers, New York NY USA, pp. 832 - 835, IFIP/IEEE International Symposium on Integrated Network Management (IM) 2013, Ghent, Belgium, 27/05/13.

On the automatic establishment of security relations for devices. / Kuntze, Nicolai; Rudolph, Carsten.

Proceedings of the 13th IFIP/IEEE International Symposium on Integrated Network Management (IM 2013). ed. / Filip De Turck; Yixin Diao; Choong Seon Hong. Vol. 2013 New York NY USA : IEEE, Institute of Electrical and Electronics Engineers, 2013. p. 832 - 835.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

TY - GEN

T1 - On the automatic establishment of security relations for devices

AU - Kuntze, Nicolai

AU - Rudolph, Carsten

PY - 2013

Y1 - 2013

UR - http://ieeexplore.ieee.org.ezproxy.lib.monash.edu.au/stamp/stamp.jsp?tp=&arnumber=6573090

M3 - Conference Paper

SN - 9783901882517

VL - 2013

SP - 832

EP - 835

BT - Proceedings of the 13th IFIP/IEEE International Symposium on Integrated Network Management (IM 2013)

A2 - De Turck, Filip

A2 - Diao, Yixin

A2 - Hong, Choong Seon

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - New York NY USA

ER -

Kuntze N, Rudolph C. On the automatic establishment of security relations for devices. In De Turck F, Diao Y, Hong CS, editors, Proceedings of the 13th IFIP/IEEE International Symposium on Integrated Network Management (IM 2013). Vol. 2013. New York NY USA: IEEE, Institute of Electrical and Electronics Engineers. 2013. p. 832 - 835