On charge point anxiety and the sharing economy

Eoin Thompson, Rodrigo Ordonez-Hurtado, Wynita Griggs, Jia Yuan Yu, Brian Mulkeen, Robert Shorten

Research output: Chapter in Book/Report/Conference proceedingConference PaperOther

2 Citations (Scopus)

Abstract

This paper addresses some of the issues surrounding the charging of electric vehicles (EVs) with a particular focus on charge points. We discuss the design and implementation of a charge point adapter. The key feature of the adapter is that it provides privately owned charge points with the opportunity to be rented to members of the public, resulting in additional charging opportunities for EVs. We present a number of use cases whereby the adapter is used to alleviate the demand for EV charging in an area that experiences a shortage of charge points, but where private, unused charge points are available.

Original languageEnglish
Title of host publication2017 IEEE 20th International Conference on Intelligent Transportation Systems (ITSC)
PublisherIEEE, Institute of Electrical and Electronics Engineers
Number of pages6
ISBN (Electronic)9781538615256
DOIs
Publication statusPublished - 14 Mar 2018
Externally publishedYes
EventIEEE Conference on Intelligent Transportation Systems 2017 - Mielparque Yokohama, Yokohama, Japan
Duration: 16 Oct 201719 Oct 2017
Conference number: 20th
https://www.ieee-jp.org/section/tokyo/chapter/ITS-38/conference/itsc2017/index.php
http://www.itsc2017.org/

Conference

ConferenceIEEE Conference on Intelligent Transportation Systems 2017
Abbreviated title ITSC 2017
CountryJapan
CityYokohama
Period16/10/1719/10/17
OtherThe IEEE Intelligent Transportation Systems Conference is the annual flagship conference of the IEEE Intelligent Transportation Systems Society. This conference welcomes articles in the field of Intelligent Transportation Systems, dealing with new developments in theory, analytical and numerical simulation and modeling, experimentation, demonstration, advanced deployment and case studies, results of laboratory or field operational tests.
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