On a Possibility of High-Resolution Characterisation of InGaAs/GaAs Multilayers Using Phase-Retrieval X-ray Diffractometry Technique

Andrei Y U Nikulin, Karen Siu, John R Davis, Brian F Usher

    Research output: Contribution to journalArticleResearchpeer-review

    Original languageEnglish
    Pages (from-to)2521 - 2526
    Number of pages6
    JournalJournal of Physics D: Applied Physics
    Publication statusPublished - 2000

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