Obtaining the J-integral by diffraction-based crack-field strain mapping

S. M. Barhli, L. Saucedo-Mora, C. Simpson, T. Becker, M. Mostafavi, P. J. Withers, T. J. Marrow

Research output: Chapter in Book/Report/Conference proceedingConference PaperOther

15 Citations (Scopus)

Abstract

The analysis by diffraction of polycrystalline materials can determine the full tensor of the elastic strains within them. Point-by-point maps of elastic strain can thus be obtained in fine-grained engineering alloys, typically using synchrotron X-rays or neutrons. In this paper, a novel approach is presented to calculate the elastic strain energy release rate of a loaded crack from two-dimensional strain maps that are obtained by diffraction. The method is based on a Finite Element approach, which uses diffraction data to obtain the parameters required to calculate the J-integral via the contour integral method. The J integral is robust to uncertainties in the crack tip position and to poor definition of the field in the crack vicinity, and does not rely on theoretical assumptions of the field shape. A validation of the technique is presented using a synthetic dataset from a finite element model. Its experimental application is demonstrated in an analysis of a synchrotron X-ray diffraction strain map for a loaded fatigue crack in a bainitic steel.

Original languageEnglish
Title of host publication21st European Conference on Fracture, ECF21, 20-24 June 2016, Catania, Italy
PublisherElsevier
Pages2519-2526
Number of pages8
Volume2
DOIs
Publication statusPublished - 2016
Externally publishedYes
EventEuropean Conference on Fracture 2016 - Catania, Italy
Duration: 20 Jun 201624 Jun 2016
Conference number: ECF21
https://www.sciencedirect.com/journal/procedia-structural-integrity/vol/2/suppl/C (Proceedings)

Conference

ConferenceEuropean Conference on Fracture 2016
Country/TerritoryItaly
CityCatania
Period20/06/1624/06/16
Internet address

Keywords

  • diffraction
  • EDXRD
  • J-integral
  • strain mapping
  • Stress-Intensity Factor
  • XRD

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