| Original language | English |
|---|---|
| Pages (from-to) | 200 - 215 |
| Number of pages | 16 |
| Journal | IEEE Journal on Selected Topics in Quantum Electronics |
| Volume | 16 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2010 |
Cite this
Rukhlenko, I., Premaratne, M., & Agrawal, G. P. (2010). Nonlinear silicon photonics: Analytical Tools. IEEE Journal on Selected Topics in Quantum Electronics, 16(1), 200 - 215. https://doi.org/10.1109/JSTQE.2009.2026435
@article{91b383a74922414e83d5fb3b7fb47359,
title = "Nonlinear silicon photonics: Analytical Tools",
author = "Ivan Rukhlenko and Malin Premaratne and Agrawal, {Govind P}",
year = "2010",
doi = "10.1109/JSTQE.2009.2026435",
language = "English",
volume = "16",
pages = "200 -- 215",
journal = "IEEE Journal on Selected Topics in Quantum Electronics",
issn = "1077-260X",
publisher = "IEEE, Institute of Electrical and Electronics Engineers",
number = "1",
}
Rukhlenko, I, Premaratne, M & Agrawal, GP 2010, 'Nonlinear silicon photonics: Analytical Tools', IEEE Journal on Selected Topics in Quantum Electronics, vol. 16, no. 1, pp. 200 - 215. https://doi.org/10.1109/JSTQE.2009.2026435
Nonlinear silicon photonics: Analytical Tools. / Rukhlenko, Ivan; Premaratne, Malin; Agrawal, Govind P.
In: IEEE Journal on Selected Topics in Quantum Electronics, Vol. 16, No. 1, 2010, p. 200 - 215.Research output: Contribution to journal › Article › Research › peer-review
TY - JOUR
T1 - Nonlinear silicon photonics: Analytical Tools
AU - Rukhlenko, Ivan
AU - Premaratne, Malin
AU - Agrawal, Govind P
PY - 2010
Y1 - 2010
UR - http://www.ieee.org.ezproxy.lib.monash.edu.au
U2 - 10.1109/JSTQE.2009.2026435
DO - 10.1109/JSTQE.2009.2026435
M3 - Article
VL - 16
SP - 200
EP - 215
JO - IEEE Journal on Selected Topics in Quantum Electronics
JF - IEEE Journal on Selected Topics in Quantum Electronics
SN - 1077-260X
IS - 1
ER -
Rukhlenko I, Premaratne M, Agrawal GP. Nonlinear silicon photonics: Analytical Tools. IEEE Journal on Selected Topics in Quantum Electronics. 2010;16(1):200 - 215. https://doi.org/10.1109/JSTQE.2009.2026435