Abstract
The segregation and trapping of Au at the moving crystal-amorphous Si interface has been measured. Epitaxial crystallization was induced by 2.5-MeV Ar-ion irradiation. The Au segregation is analogous to behavior at liquid-solid interfaces except that the interfacial segregation coefficient of 0.007 at 320°C is independent of velocity between 0.6 and 6 A/sec. The Au is trapped in crystalline Si at concentrations some 10 orders of magnitude in excess of equilibrium concentration.
| Original language | English |
|---|---|
| Pages (from-to) | 1322-1325 |
| Number of pages | 4 |
| Journal | Physical Review Letters |
| Volume | 60 |
| Issue number | 13 |
| DOIs | |
| Publication status | Published - 1988 |
| Externally published | Yes |
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