Abstract
The segregation and trapping of Au at the moving crystal-amorphous Si interface has been measured. Epitaxial crystallization was induced by 2.5-MeV Ar-ion irradiation. The Au segregation is analogous to behavior at liquid-solid interfaces except that the interfacial segregation coefficient of 0.007 at 320°C is independent of velocity between 0.6 and 6 A/sec. The Au is trapped in crystalline Si at concentrations some 10 orders of magnitude in excess of equilibrium concentration.
Original language | English |
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Pages (from-to) | 1322-1325 |
Number of pages | 4 |
Journal | Physical Review Letters |
Volume | 60 |
Issue number | 13 |
DOIs | |
Publication status | Published - 1988 |
Externally published | Yes |