New approach towards imaging λ-DNA using scanning tunneling microscopy/spectroscopy (STM/STS)

Shirshendu Dey, Sushama Pethkar, Suguna D. Adyanthaya, Murali Sastry, C. V. Dharmadhikari

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1 Citation (Scopus)


A new methodology to anchor λ-DNA to silanized n-Si(111) surface using Langmuir Blodget trough was developed. The n-Si (111) was silanized by treating it with low molecular weight octyltrichlorosilane in toluene. Scanning tunneling microscopy (STM) image of λ-DNA on octyltrichlorosilane deposited Si substrate shows areas exhibiting arrayed structures of 700 nm length and 40 nm spacing. Scanning tunneling spectroscopy (STS) at different stages depict a broad distribution of defect states in the bandgap region of n-Si(111) which presumably facilitates tunneling through otherwise insulating DNA layer.

Original languageEnglish
Pages (from-to)309-312
Number of pages4
JournalBulletin of Materials Science
Issue number3
Publication statusPublished - Jun 2008
Externally publishedYes


  • DNA
  • Langmuir Blodget technique
  • Scanning tunneling microscopy
  • Silanization

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