Near-field scanning optical microscopy of luminescent nanostructured semiconductors

Laszlo Frazer, Heyou Zhang, Chun Kiu Ng, Pegah Maasoumi, Jacek Jasieniak, Paul Mulvaney, Alison Funston

Research output: Contribution to conferencePoster


The ability to image nanostructures with far-field visible light optics is lim-ited by diffraction. We use Near-field Scanning Optical Microscopy (NSOM/SNOM) to increase resolution of luminescence imaging, while avoiding radiation damage.

Original languageEnglish
Number of pages2
Publication statusPublished - 1 Jan 2019
EventIntegrated Photonics Research, Silicon and Nanophotonics 2019 - Burlingame, United States of America
Duration: 29 Jul 20191 Aug 2019


ConferenceIntegrated Photonics Research, Silicon and Nanophotonics 2019
Abbreviated titleIPRSN 2019
CountryUnited States of America
Internet address

Cite this