Near-field scanning optical microscopy of luminescent nanostructured semiconductors

Laszlo Frazer, Heyou Zhang, Chun Kiu Ng, Pegah Maasoumi, Jacek Jasieniak, Paul Mulvaney, Alison Funston

Research output: Contribution to conferencePoster

Abstract

The ability to image nanostructures with far-field visible light optics is lim-ited by diffraction. We use Near-field Scanning Optical Microscopy (NSOM/SNOM) to increase resolution of luminescence imaging, while avoiding radiation damage.

Original languageEnglish
Number of pages2
Publication statusPublished - 1 Jan 2019
EventIntegrated Photonics Research, Silicon and Nanophotonics 2019 - Burlingame, United States of America
Duration: 29 Jul 20191 Aug 2019
https://www.osa.org/en-us/meetings/osa_meetings/advanced_photonics_congress/about/

Conference

ConferenceIntegrated Photonics Research, Silicon and Nanophotonics 2019
Abbreviated titleIPRSN 2019
CountryUnited States of America
CityBurlingame
Period29/07/191/08/19
Internet address

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