Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system

Nicholas Pilet, Jorg Raabe, Stephanie E Stevenson, Sara Romer, Laetitia Bernard, Christopher Robert McNeill, Rainer Fink, Hans J Hug, Christoph Quitmann

Research output: Contribution to journalArticleResearchpeer-review

24 Citations (Scopus)
Original languageEnglish
Pages (from-to)1 - 8
Number of pages8
JournalNanotechnology
Volume23
Issue number47
DOIs
Publication statusPublished - 2012

Cite this

Pilet, Nicholas ; Raabe, Jorg ; Stevenson, Stephanie E ; Romer, Sara ; Bernard, Laetitia ; McNeill, Christopher Robert ; Fink, Rainer ; Hug, Hans J ; Quitmann, Christoph. / Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system. In: Nanotechnology. 2012 ; Vol. 23, No. 47. pp. 1 - 8.
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Pilet, N, Raabe, J, Stevenson, SE, Romer, S, Bernard, L, McNeill, CR, Fink, R, Hug, HJ & Quitmann, C 2012, 'Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system', Nanotechnology, vol. 23, no. 47, pp. 1 - 8. https://doi.org/10.1088/0957-4484/23/47/475708

Nanostructure characterization by a combined x-ray absorption/scanning force microscopy system. / Pilet, Nicholas; Raabe, Jorg; Stevenson, Stephanie E; Romer, Sara; Bernard, Laetitia; McNeill, Christopher Robert; Fink, Rainer; Hug, Hans J; Quitmann, Christoph.

In: Nanotechnology, Vol. 23, No. 47, 2012, p. 1 - 8.

Research output: Contribution to journalArticleResearchpeer-review

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AU - Pilet, Nicholas

AU - Raabe, Jorg

AU - Stevenson, Stephanie E

AU - Romer, Sara

AU - Bernard, Laetitia

AU - McNeill, Christopher Robert

AU - Fink, Rainer

AU - Hug, Hans J

AU - Quitmann, Christoph

PY - 2012

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