Nanoscale velocity - drag force relationship in thin liquid layers measured by atomic force microscopy

Adam Istvan Mechler, Brian Piorek, R Lal, Sanjoy Banerjee

Research output: Contribution to journalArticleResearchpeer-review

15 Citations (Scopus)
Original languageEnglish
Pages (from-to)3881 - 3883
Number of pages3
JournalApplied Physics Letters
Volume85
Issue number17
Publication statusPublished - 2004

Cite this

Mechler, A. I., Piorek, B., Lal, R., & Banerjee, S. (2004). Nanoscale velocity - drag force relationship in thin liquid layers measured by atomic force microscopy. Applied Physics Letters, 85(17), 3881 - 3883.