Nanoscale resolution microchannel flow velocimetry by atomic force microscopy

Brian Piorek, Adam Istvan Mechler, Ratnesh Lai, Patrick Freudenthal, Carl Meinhart, Sanjoy Banerjee

Research output: Contribution to journal › Article › Research › peer-review

Cite this

Piorek, B., Mechler, A. I., Lai, R., Freudenthal, P., Meinhart, C., & Banerjee, S. (2006). Nanoscale resolution microchannel flow velocimetry by atomic force microscopy. Applied Physics Letters, 89(15123), 1 - 3.

@article{50b9388880354c0a91dca2e1051c06d8,

title = "Nanoscale resolution microchannel flow velocimetry by atomic force microscopy",

author = "Brian Piorek and Mechler, {Adam Istvan} and Ratnesh Lai and Patrick Freudenthal and Carl Meinhart and Sanjoy Banerjee",

year = "2006",

language = "English",

volume = "89",

pages = "1 -- 3",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "AIP Publishing",

number = "15123",

}