Nanoresolution profiling of metal-metal interfaces from x-ray Fraunhofer diffraction data

Aliaksandr V Darahanau; Andrei Yurievich Nikulin; Ruben A Dilanian; Barrington Charles Muddle; A Yu Souvorov; Y Nishino; T Ishikawa

doi:10.1063/1.2217163

Nanoresolution profiling of metal-metal interfaces from x-ray Fraunhofer diffraction data

Aliaksandr V Darahanau, Andrei Yurievich Nikulin, Ruben A Dilanian, Barrington Charles Muddle, A Yu Souvorov, Y Nishino, T Ishikawa

Research output: Contribution to journal › Article › Research › peer-review

3 Citations (Scopus)

Original language	English
Article number	263113
Number of pages	3
Journal	Applied Physics Letters
Volume	88
Issue number	26
DOIs	https://doi.org/10.1063/1.2217163
Publication status	Published - 2006

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10.1063/1.2217163

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title = "Nanoresolution profiling of metal-metal interfaces from x-ray Fraunhofer diffraction data",

author = "Darahanau, \{Aliaksandr V\} and Nikulin, \{Andrei Yurievich\} and Dilanian, \{Ruben A\} and Muddle, \{Barrington Charles\} and Souvorov, \{A Yu\} and Y Nishino and T Ishikawa",

year = "2006",

doi = "10.1063/1.2217163",

language = "English",

volume = "88",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

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TY - JOUR

T1 - Nanoresolution profiling of metal-metal interfaces from x-ray Fraunhofer diffraction data

AU - Darahanau, Aliaksandr V

AU - Nikulin, Andrei Yurievich

AU - Dilanian, Ruben A

AU - Muddle, Barrington Charles

AU - Souvorov, A Yu

AU - Nishino, Y

AU - Ishikawa, T

PY - 2006

Y1 - 2006

UR - https://www.scopus.com/pages/publications/33745685309

U2 - 10.1063/1.2217163

DO - 10.1063/1.2217163

M3 - Article

SN - 0003-6951

VL - 88

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 26

M1 - 263113

ER -

Nanoresolution profiling of metal-metal interfaces from x-ray Fraunhofer diffraction data

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