Nanoresolution profiling of metal-metal interfaces from x-ray Fraunhofer diffraction data

Aliaksandr V Darahanau, Andrei Yurievich Nikulin, Ruben A Dilanian, Barrington Charles Muddle, A Yu Souvorov, Y Nishino, T Ishikawa

    Research output: Contribution to journalArticleResearchpeer-review

    3 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)263113-1 - 263113-3
    Number of pages3
    JournalApplied Physics Letters
    Issue number26
    Publication statusPublished - 2006

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