Nanoresolution profiling of metal-metal interfaces from x-ray Fraunhofer diffraction data

Aliaksandr V Darahanau, Andrei Yurievich Nikulin, Ruben A Dilanian, Barrington Charles Muddle, A Yu Souvorov, Y Nishino, T Ishikawa

    Research output: Contribution to journalArticleResearchpeer-review

    3 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)263113-1 - 263113-3
    Number of pages3
    JournalApplied Physics Letters
    Volume88
    Issue number26
    DOIs
    Publication statusPublished - 2006

    Cite this

    Darahanau, A. V., Nikulin, A. Y., Dilanian, R. A., Muddle, B. C., Souvorov, A. Y., Nishino, Y., & Ishikawa, T. (2006). Nanoresolution profiling of metal-metal interfaces from x-ray Fraunhofer diffraction data. Applied Physics Letters, 88(26), 263113-1 - 263113-3. https://doi.org/10.1063/1.2217163