Nanoresolution profiling of metal-metal interfaces from x-ray Fraunhofer diffraction data

Aliaksandr V Darahanau; Andrei Yurievich Nikulin; Ruben A Dilanian; Barrington Charles Muddle; A Yu Souvorov; Y Nishino; T Ishikawa

doi:10.1063/1.2217163

Nanoresolution profiling of metal-metal interfaces from x-ray Fraunhofer diffraction data

Aliaksandr V Darahanau, Andrei Yurievich Nikulin, Ruben A Dilanian, Barrington Charles Muddle, A Yu Souvorov, Y Nishino, T Ishikawa

Research output: Contribution to journal › Article › Research › peer-review

3 Citations (Scopus)

Original language	English
Pages (from-to)	263113-1 - 263113-3
Number of pages	3
Journal	Applied Physics Letters
Volume	88
Issue number	26
DOIs	https://doi.org/10.1063/1.2217163
Publication status	Published - 2006

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10.1063/1.2217163

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title = "Nanoresolution profiling of metal-metal interfaces from x-ray Fraunhofer diffraction data",

author = "Darahanau, {Aliaksandr V} and Nikulin, {Andrei Yurievich} and Dilanian, {Ruben A} and Muddle, {Barrington Charles} and Souvorov, {A Yu} and Y Nishino and T Ishikawa",

year = "2006",

doi = "10.1063/1.2217163",

language = "English",

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T1 - Nanoresolution profiling of metal-metal interfaces from x-ray Fraunhofer diffraction data

AU - Darahanau, Aliaksandr V

AU - Nikulin, Andrei Yurievich

AU - Dilanian, Ruben A

AU - Muddle, Barrington Charles

AU - Souvorov, A Yu

AU - Nishino, Y

AU - Ishikawa, T

PY - 2006

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UR - http://<Go to ISI>://000238717200069

U2 - 10.1063/1.2217163

DO - 10.1063/1.2217163

M3 - Article

SN - 0003-6951

VL - 88

SP - 263113-1 - 263113-3

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 26

ER -

Nanoresolution profiling of metal-metal interfaces from x-ray Fraunhofer diffraction data

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