Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data

Aliaksandr V Darahanau, Andrei Yurievich Nikulin, A Yu Souvorov, Y Nishino, Barrington Charles Muddle, T Ishikawa

Research output: Contribution to journalArticleResearchpeer-review

11 Citations (Scopus)
Original languageEnglish
Pages (from-to)494 - 498
Number of pages5
JournalPhysics Letters A
Issue number5-6
Publication statusPublished - 2005

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