Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data

Aliaksandr V Darahanau; Andrei Yurievich Nikulin; A Yu Souvorov; Y Nishino; Barrington Charles Muddle; T Ishikawa

doi:10.1016/j.physleta.2004.10.084

Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data

Aliaksandr V Darahanau, Andrei Yurievich Nikulin, A Yu Souvorov, Y Nishino, Barrington Charles Muddle, T Ishikawa

Materials Science & Engineering

Research output: Contribution to journal › Article › Research › peer-review

11 Citations (Scopus)

Original language	English
Pages (from-to)	494 - 498
Number of pages	5
Journal	Physics Letters A
Volume	335
Issue number	5-6
DOIs	https://doi.org/10.1016/j.physleta.2004.10.084
Publication status	Published - 2005

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10.1016/j.physleta.2004.10.084

Cite this

@article{3ed187574a9d4c0ba8ee7c095ab2ec84,

title = "Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data",

author = "Darahanau, {Aliaksandr V} and Nikulin, {Andrei Yurievich} and Souvorov, {A Yu} and Y Nishino and Muddle, {Barrington Charles} and T Ishikawa",

year = "2005",

doi = "10.1016/j.physleta.2004.10.084",

language = "English",

volume = "335",

pages = "494 -- 498",

journal = "Physics Letters A",

issn = "0375-9601",

publisher = "Elsevier BV",

number = "5-6",

}

TY - JOUR

T1 - Nano-resolution profiling of micro-structures using quantitative X-ray phase retrieval from Fraunhofer diffraction data

AU - Darahanau, Aliaksandr V

AU - Nikulin, Andrei Yurievich

AU - Souvorov, A Yu

AU - Nishino, Y

AU - Muddle, Barrington Charles

AU - Ishikawa, T

PY - 2005

Y1 - 2005

U2 - 10.1016/j.physleta.2004.10.084

DO - 10.1016/j.physleta.2004.10.084

M3 - Article

SN - 0375-9601

VL - 335

SP - 494

EP - 498

JO - Physics Letters A

JF - Physics Letters A

IS - 5-6

ER -