Mp-dissimilarity: a data dependent dissimilarity measure

Sunil Aryal, Kai Ming Ting, Gholamreza Haffari, Takashi Washio

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    17 Citations (Scopus)
    Original languageEnglish
    Title of host publicationProceedings, 14th IEEE International Conference on Data Mining (ICDM 2014)
    EditorsRavi Kumar, Hannu Toivonen, Jian Pei, Joshua Zhexue Huang, Xindong Wu
    Place of PublicationLos Alamitos CA USA
    PublisherIEEE Computer Society
    Pages707 - 712
    Number of pages6
    ISBN (Print)9781479943029
    DOIs
    Publication statusPublished - 2014
    EventIEEE International Conference on Data Mining 2014 - Shenzhen, China
    Duration: 14 Dec 201417 Dec 2014
    Conference number: 14th
    http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7022262 (Conference Proceedings)

    Conference

    ConferenceIEEE International Conference on Data Mining 2014
    Abbreviated titleICDM 2014
    CountryChina
    CityShenzhen
    Period14/12/1417/12/14
    Internet address

    Cite this

    Aryal, S., Ting, K. M., Haffari, G., & Washio, T. (2014). Mp-dissimilarity: a data dependent dissimilarity measure. In R. Kumar, H. Toivonen, J. Pei, J. Z. Huang, & X. Wu (Eds.), Proceedings, 14th IEEE International Conference on Data Mining (ICDM 2014) (pp. 707 - 712). IEEE Computer Society. https://doi.org/10.1109/ICDM.2014.33