Monitoring of crack growth beneath a bonded repair using Bragg gratings

I McKenzie, Rhys Jones, Wing Kong Chiu, D Booth

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	Smart Electronics and MEMS
Place of Publication	USA
Publisher	SPIE - International Society for Optical Engineering
Pages	272 - 283
Number of pages	12
ISBN (Print)	0-8194-2680-6
Publication status	Published - 1997
Event	Smart Electronics and MEMS - Adelaide, USA Duration: 1 Jan 1997 → …

Cite this

@inproceedings{fbc67fd2666b46d9b86c0c385c4b1948,

title = "Monitoring of crack growth beneath a bonded repair using Bragg gratings",

author = "I McKenzie and Rhys Jones and Chiu, {Wing Kong} and D Booth",

year = "1997",

language = "English",

isbn = "0-8194-2680-6",

pages = "272 -- 283",

booktitle = "Smart Electronics and MEMS",

publisher = "SPIE - International Society for Optical Engineering",

address = "United States of America",

note = "Smart Electronics and MEMS ; Conference date: 01-01-1997",

}

TY - GEN

T1 - Monitoring of crack growth beneath a bonded repair using Bragg gratings

AU - McKenzie, I

AU - Jones, Rhys

AU - Chiu, Wing Kong

AU - Booth, D

PY - 1997

Y1 - 1997

M3 - Conference Paper

SN - 0-8194-2680-6

SP - 272

EP - 283

BT - Smart Electronics and MEMS

PB - SPIE - International Society for Optical Engineering

CY - USA

T2 - Smart Electronics and MEMS

Y2 - 1 January 1997

ER -