Modelling of a high count rate energy resolving CdTe pixel detector for the performance characterisation of a medical imaging system

Marie Ruat, Gregory Potter, Matthew R. Dimmock, Andrew Berry

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

2 Citations (Scopus)


Compound semiconductors detectors, such as Cadmium Telluride (CdTe) and Cadmium Zinc Telluride (CdZnTe), have demonstrated spectroscopic performances for X- and Gamma-ray detection at room temperature operation. Several groups are working on using these detector materials for use in high rate photon counting / energy resolving pixelated detector systems. This paper is focused on the modelling from source to pixel output for the evaluation of the material and the architecture of such detectors. A complete three-dimensional numerical model is presented, coupling the GEANT4 Monte-Carlo modelling of the interaction of incident photons with detector material and computation of applied potential, weighting field and free charge carriers transport including trapping using Finite Elements Method in COMSOL. A 3D mapping of Charge Induction Efficiency (CIE) into the volume of the detector is obtained. The GEANT4 and COMSOL interface has been implemented into Matlab for convenient input into a generic model developed in parallel for the read-out electronics. Simulated detection spectra at pixel ouput are obtained and discussed for various detector thicknesses.

Original languageEnglish
Title of host publicationIEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010
Number of pages5
Publication statusPublished - 2010
EventIEEE Nuclear Science Symposium and Medical Imaging Conference 2010 - Knoxville, United States of America
Duration: 30 Oct 20106 Nov 2010


ConferenceIEEE Nuclear Science Symposium and Medical Imaging Conference 2010
Abbreviated titleNSS/MIC 2010
CountryUnited States of America
Other2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010

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