Modeling secondary electron imaging at atomic resolution using a focused coherent electron probe

L. J. Allen, H. G. Brown, Adrian J. D'Alfonso, Jim Ciston, Y. Lin, L. D. Marks

Research output: Contribution to journalMeeting Abstractpeer-review

Original languageEnglish
Pages (from-to)82-83
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue numberS3
DOIs
Publication statusPublished - 1 Aug 2014
Externally publishedYes

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