Original language | English |
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Pages (from-to) | 82-83 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 20 |
Issue number | S3 |
DOIs | |
Publication status | Published - 1 Aug 2014 |
Externally published | Yes |
Modeling secondary electron imaging at atomic resolution using a focused coherent electron probe
L. J. Allen, H. G. Brown, Adrian J. D'Alfonso, Jim Ciston, Y. Lin, L. D. Marks
Research output: Contribution to journal › Meeting Abstract › peer-review