Modeling secondary electron imaging at atomic resolution using a focused coherent electron probe

L. J. Allen, H. G. Brown, Adrian J. D'Alfonso, Jim Ciston, Y. Lin, L. D. Marks

Research output: Contribution to journal › Article › Other › peer-review

Original language	English
Pages (from-to)	82-83
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S143192761400213X
Publication status	Published - 1 Aug 2014
Externally published	Yes

Cite this

@article{5e5a2b2e8c4f4887abdbea41dc431e14,

title = "Modeling secondary electron imaging at atomic resolution using a focused coherent electron probe",

author = "Allen, {L. J.} and Brown, {H. G.} and D'Alfonso, {Adrian J.} and Jim Ciston and Y. Lin and Marks, {L. D.}",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S143192761400213X",

language = "English",

volume = "20",

pages = "82--83",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "3",

}

TY - JOUR

T1 - Modeling secondary electron imaging at atomic resolution using a focused coherent electron probe

AU - Allen, L. J.

AU - Brown, H. G.

AU - D'Alfonso, Adrian J.

AU - Ciston, Jim

AU - Lin, Y.

AU - Marks, L. D.

PY - 2014/8/1

Y1 - 2014/8/1

UR - http://www.scopus.com/inward/record.url?scp=84927947664&partnerID=8YFLogxK

U2 - 10.1017/S143192761400213X

DO - 10.1017/S143192761400213X

M3 - Article

AN - SCOPUS:84927947664

VL - 20

SP - 82

EP - 83

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - 3

ER -