Modeling secondary electron imaging at atomic resolution using a focused coherent electron probe

L. J. Allen, H. G. Brown, Adrian J. D'Alfonso, Jim Ciston, Y. Lin, L. D. Marks

Research output: Contribution to journalArticleOtherpeer-review

Original languageEnglish
Pages (from-to)82-83
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
Publication statusPublished - 1 Aug 2014
Externally publishedYes

Cite this

Allen, L. J., Brown, H. G., D'Alfonso, A. J., Ciston, J., Lin, Y., & Marks, L. D. (2014). Modeling secondary electron imaging at atomic resolution using a focused coherent electron probe. Microscopy and Microanalysis, 20(3), 82-83. https://doi.org/10.1017/S143192761400213X