Mode profiling of semiconductor nanowire lasers

Dhruv Saxena; Fan Wang; Qian Gao; Sudha Mokkapati; Hark Hoe Tan; Chennupati Jagadish

doi:10.1021/acs.nanolett.5b01713

Mode profiling of semiconductor nanowire lasers

Dhruv Saxena, Fan Wang, Qian Gao, Sudha Mokkapati, Hark Hoe Tan, Chennupati Jagadish

Research output: Contribution to journal › Article › Research › peer-review

77 Citations (Scopus)

Abstract

We experimentally determine the lasing mode(s) in optically pumped semiconductor nanowire lasers. The spatially resolved and angle-resolved far-field emission profiles of single InP nanowire lasers lying horizontally on a SiO₂ substrate are characterized in a microphotoluminescence (μ-PL) setup. The experimentally obtained polarization dependent far-field profiles match very well with numerical simulations and enable unambiguous identification of the lasing mode(s). This technique can be applied to characterize lasing modes in other type of nanolasers that are integrated on a substrate in either vertical or horizontal configurations.

Original language	English
Pages (from-to)	5342-5348
Number of pages	7
Journal	Nano Letters
Volume	15
Issue number	8
DOIs	https://doi.org/10.1021/acs.nanolett.5b01713
Publication status	Published - 12 Aug 2015
Externally published	Yes

Keywords

far-field characterization
Fourier space imaging
mode characterization
Nanowire lasers
semiconductor nanowires

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10.1021/acs.nanolett.5b01713

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title = "Mode profiling of semiconductor nanowire lasers",

abstract = "We experimentally determine the lasing mode(s) in optically pumped semiconductor nanowire lasers. The spatially resolved and angle-resolved far-field emission profiles of single InP nanowire lasers lying horizontally on a SiO2 substrate are characterized in a microphotoluminescence (μ-PL) setup. The experimentally obtained polarization dependent far-field profiles match very well with numerical simulations and enable unambiguous identification of the lasing mode(s). This technique can be applied to characterize lasing modes in other type of nanolasers that are integrated on a substrate in either vertical or horizontal configurations.",

keywords = "far-field characterization, Fourier space imaging, mode characterization, Nanowire lasers, semiconductor nanowires",

author = "Dhruv Saxena and Fan Wang and Qian Gao and Sudha Mokkapati and Tan, {Hark Hoe} and Chennupati Jagadish",

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T1 - Mode profiling of semiconductor nanowire lasers

AU - Saxena, Dhruv

AU - Wang, Fan

AU - Gao, Qian

AU - Mokkapati, Sudha

AU - Tan, Hark Hoe

AU - Jagadish, Chennupati

PY - 2015/8/12

Y1 - 2015/8/12

N2 - We experimentally determine the lasing mode(s) in optically pumped semiconductor nanowire lasers. The spatially resolved and angle-resolved far-field emission profiles of single InP nanowire lasers lying horizontally on a SiO2 substrate are characterized in a microphotoluminescence (μ-PL) setup. The experimentally obtained polarization dependent far-field profiles match very well with numerical simulations and enable unambiguous identification of the lasing mode(s). This technique can be applied to characterize lasing modes in other type of nanolasers that are integrated on a substrate in either vertical or horizontal configurations.

AB - We experimentally determine the lasing mode(s) in optically pumped semiconductor nanowire lasers. The spatially resolved and angle-resolved far-field emission profiles of single InP nanowire lasers lying horizontally on a SiO2 substrate are characterized in a microphotoluminescence (μ-PL) setup. The experimentally obtained polarization dependent far-field profiles match very well with numerical simulations and enable unambiguous identification of the lasing mode(s). This technique can be applied to characterize lasing modes in other type of nanolasers that are integrated on a substrate in either vertical or horizontal configurations.

KW - far-field characterization

KW - Fourier space imaging

KW - mode characterization

KW - Nanowire lasers

KW - semiconductor nanowires

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DO - 10.1021/acs.nanolett.5b01713

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SN - 1530-6984

VL - 15

SP - 5342

EP - 5348

JO - Nano Letters

JF - Nano Letters

IS - 8

ER -

Mode profiling of semiconductor nanowire lasers

Abstract

Keywords

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