Microstructural study of a passivation layer on GaAs: An application of X-ray reflectivity under grazing angles using a synchrotron source

Kylie Elizabeth Crompton, Trevor R Finlayson, C Kirchner, M Seitz, Uwe Klemradt

Research output: Contribution to journalArticleResearchpeer-review

2 Citations (Scopus)
Original languageEnglish
Pages (from-to)373 - 379
Number of pages7
JournalSurface Review and Letters
Issue number2 and 3
Publication statusPublished - 2003

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