Microstructural characteristics of electron beam processed AI-2Sc

Dacian Tomus, Ma Qian, Penny Yu, Craig Brice, Colleen Bettles, Barrington Muddle

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

Original languageEnglish
Title of host publicationMaterials Science Forum
EditorsJian-Feng Nie, Allan Morton
Place of PublicationSwitzerland
PublisherTrans Tech Publications
Pages910 - 913
Number of pages4
Volume654-656
ISBN (Print)1662-9752
DOIs
Publication statusPublished - 2010
EventPacific Rim International Congress on Advanced Materials and Processing 2010 - Cairns Qld Australia, Cairns, Australia
Duration: 2 Aug 20106 Aug 2010
Conference number: 7th

Conference

ConferencePacific Rim International Congress on Advanced Materials and Processing 2010
Abbreviated titlePRICM-7
CountryAustralia
CityCairns
Period2/08/106/08/10

Cite this

Tomus, D., Qian, M., Yu, P., Brice, C., Bettles, C., & Muddle, B. (2010). Microstructural characteristics of electron beam processed AI-2Sc. In J-F. Nie, & A. Morton (Eds.), Materials Science Forum (Vol. 654-656, pp. 910 - 913). Switzerland: Trans Tech Publications. https://doi.org/10.4028/www.scientific.net/MSF.654-656.910
Tomus, Dacian ; Qian, Ma ; Yu, Penny ; Brice, Craig ; Bettles, Colleen ; Muddle, Barrington. / Microstructural characteristics of electron beam processed AI-2Sc. Materials Science Forum. editor / Jian-Feng Nie ; Allan Morton. Vol. 654-656 Switzerland : Trans Tech Publications, 2010. pp. 910 - 913
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author = "Dacian Tomus and Ma Qian and Penny Yu and Craig Brice and Colleen Bettles and Barrington Muddle",
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Tomus, D, Qian, M, Yu, P, Brice, C, Bettles, C & Muddle, B 2010, Microstructural characteristics of electron beam processed AI-2Sc. in J-F Nie & A Morton (eds), Materials Science Forum. vol. 654-656, Trans Tech Publications, Switzerland, pp. 910 - 913, Pacific Rim International Congress on Advanced Materials and Processing 2010, Cairns, Australia, 2/08/10. https://doi.org/10.4028/www.scientific.net/MSF.654-656.910

Microstructural characteristics of electron beam processed AI-2Sc. / Tomus, Dacian; Qian, Ma; Yu, Penny; Brice, Craig; Bettles, Colleen; Muddle, Barrington.

Materials Science Forum. ed. / Jian-Feng Nie; Allan Morton. Vol. 654-656 Switzerland : Trans Tech Publications, 2010. p. 910 - 913.

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

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T1 - Microstructural characteristics of electron beam processed AI-2Sc

AU - Tomus, Dacian

AU - Qian, Ma

AU - Yu, Penny

AU - Brice, Craig

AU - Bettles, Colleen

AU - Muddle, Barrington

PY - 2010

Y1 - 2010

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DO - 10.4028/www.scientific.net/MSF.654-656.910

M3 - Conference Paper

SN - 1662-9752

VL - 654-656

SP - 910

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BT - Materials Science Forum

A2 - Nie, Jian-Feng

A2 - Morton, Allan

PB - Trans Tech Publications

CY - Switzerland

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Tomus D, Qian M, Yu P, Brice C, Bettles C, Muddle B. Microstructural characteristics of electron beam processed AI-2Sc. In Nie J-F, Morton A, editors, Materials Science Forum. Vol. 654-656. Switzerland: Trans Tech Publications. 2010. p. 910 - 913 https://doi.org/10.4028/www.scientific.net/MSF.654-656.910