Microstructural characteristics of electron beam processed AI-2Sc

Dacian Tomus; Ma Qian; Penny Yu; Craig Brice; Colleen Bettles; Barrington Muddle

doi:10.4028/www.scientific.net/MSF.654-656.910

Microstructural characteristics of electron beam processed AI-2Sc

Dacian Tomus, Ma Qian, Penny Yu, Craig Brice, Colleen Bettles, Barrington Muddle

Materials Science & Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

2 Citations (Scopus)

Original language	English
Title of host publication	Pacific Rim International Conference on Advanced Materials and Processing Proceedings
Editors	Jian-Feng Nie, Allan Morton
Place of Publication	Switzerland
Publisher	Trans Tech Publications
Pages	910 - 913
Number of pages	4
DOIs	https://doi.org/10.4028/www.scientific.net/MSF.654-656.910
Publication status	Published - 2010
Event	Pacific Rim International Conference on Advanced Materials and Processing 2010 - Cairns Qld Australia, Cairns, Australia Duration: 2 Aug 2010 → 6 Aug 2010 Conference number: 7th

Publication series

Name	Materials Science Forum
Publisher	Trans Tech Publications
Volume	654-656
ISSN (Print)	0255-5476
ISSN (Electronic)	1662-9752

Conference

Conference	Pacific Rim International Conference on Advanced Materials and Processing 2010
Abbreviated title	PRICM-7
Country/Territory	Australia
City	Cairns
Period	2/08/10 → 6/08/10

Access to Document

10.4028/www.scientific.net/MSF.654-656.910

Centre for Electron Microscopy (MCEM)
Flame Sorrell (Manager) & Peter Miller (Manager)
Office of the Vice-Provost (Research and Research Infrastructure)
Facility/equipment: Facility

Cite this

Tomus, D., Qian, M., Yu, P., Brice, C., Bettles, C., & Muddle, B. (2010). Microstructural characteristics of electron beam processed AI-2Sc. In J.-F. Nie, & A. Morton (Eds.), Pacific Rim International Conference on Advanced Materials and Processing Proceedings (pp. 910 - 913). (Materials Science Forum; Vol. 654-656). Trans Tech Publications. https://doi.org/10.4028/www.scientific.net/MSF.654-656.910

@inproceedings{8c010cbb0efe4d85825351a7c996deb8,

title = "Microstructural characteristics of electron beam processed AI-2Sc",

author = "Dacian Tomus and Ma Qian and Penny Yu and Craig Brice and Colleen Bettles and Barrington Muddle",

year = "2010",

doi = "10.4028/www.scientific.net/MSF.654-656.910",

language = "English",

series = "Materials Science Forum",

publisher = "Trans Tech Publications",

pages = "910 -- 913",

editor = "Jian-Feng Nie and Allan Morton",

booktitle = "Pacific Rim International Conference on Advanced Materials and Processing Proceedings",

address = "Switzerland",

note = "Pacific Rim International Conference on Advanced Materials and Processing 2010, PRICM-7 ; Conference date: 02-08-2010 Through 06-08-2010",

}

Tomus, D, Qian, M, Yu, P, Brice, C, Bettles, C & Muddle, B 2010, Microstructural characteristics of electron beam processed AI-2Sc. in J-F Nie & A Morton (eds), Pacific Rim International Conference on Advanced Materials and Processing Proceedings. Materials Science Forum, vol. 654-656, Trans Tech Publications, Switzerland, pp. 910 - 913, Pacific Rim International Conference on Advanced Materials and Processing 2010, Cairns, Queensland, Australia, 2/08/10. https://doi.org/10.4028/www.scientific.net/MSF.654-656.910

Microstructural characteristics of electron beam processed AI-2Sc. / Tomus, Dacian; Qian, Ma; Yu, Penny et al.
Pacific Rim International Conference on Advanced Materials and Processing Proceedings. ed. / Jian-Feng Nie; Allan Morton. Switzerland: Trans Tech Publications, 2010. p. 910 - 913 (Materials Science Forum; Vol. 654-656).

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Microstructural characteristics of electron beam processed AI-2Sc

AU - Tomus, Dacian

AU - Qian, Ma

AU - Yu, Penny

AU - Brice, Craig

AU - Bettles, Colleen

AU - Muddle, Barrington

N1 - Conference code: 7th

PY - 2010

Y1 - 2010

U2 - 10.4028/www.scientific.net/MSF.654-656.910

DO - 10.4028/www.scientific.net/MSF.654-656.910

M3 - Conference Paper

T3 - Materials Science Forum

SP - 910

EP - 913

BT - Pacific Rim International Conference on Advanced Materials and Processing Proceedings

A2 - Nie, Jian-Feng

A2 - Morton, Allan

PB - Trans Tech Publications

CY - Switzerland

T2 - Pacific Rim International Conference on Advanced Materials and Processing 2010

Y2 - 2 August 2010 through 6 August 2010

ER -

Microstructural characteristics of electron beam processed AI-2Sc

Publication series

Conference

Access to Document

Equipment

Centre for Electron Microscopy (MCEM)

Cite this