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Megahertz x-ray microscopy at x-ray free-electron laser and synchrotron sources

  • Patrik Vagovič
  • , Tokushi Sato
  • , Ladislav Mikeš
  • , Grant Mills
  • , Rita Graceffa
  • , Frans Mattsson
  • , Pablo Villanueva-Perez
  • , Alexey Ershov
  • , Tomáš Faragó
  • , Jozef Uličný
  • , Henry Kirkwood
  • , Romain Letrun
  • , Rajmund Mokso
  • , Marie Christine Zdora
  • , Margie P. Olbinado
  • , Alexander Rack
  • , Tilo Baumbach
  • , Joachim Schulz
  • , Alke Meents
  • , Henry N. Chapman
  • Adrian P. Mancuso

Research output: Contribution to journalArticleResearchpeer-review

Abstract

Modern emerging technologies, such as additive manufacturing, bioprinting, and new material production, require novel metrology tools to probe fundamental high-speed dynamics happening in such systems. Here we demonstrate the application of the megahertz (MHz) European X-ray Free-Electron Laser (EuXFEL) to image the fast stochastic processes induced by a laser on water-filled capillaries with micrometer-scale spatial resolution. The EuXFEL provides superior contrast and spatial resolution compared to equivalent state-of-the-art synchrotron experiments. This work opens up new possibilities for the characterization of MHz stochastic processes on the nanosecond to microsecond time scales with object velocities up to a few kilometers per second using XFEL sources.

Original languageEnglish
Pages (from-to)1106-1109
Number of pages4
JournalOptica
Volume6
Issue number9
DOIs
Publication statusPublished - 2019
Externally publishedYes

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