Measuring the thickness of few-layer graphene by laser scanning microscopy

B G Ghamsari; Jacob Tosado; A P Zhuravel; Mahito Yamamoto; Daniel R Lenski; Jinglei Ping; Michael Fuhrer; S M Anlage

doi:10.1109/CPEM.2012.6251000

Measuring the thickness of few-layer graphene by laser scanning microscopy

B G Ghamsari, Jacob Tosado, A P Zhuravel, Mahito Yamamoto, Daniel R Lenski, Jinglei Ping, Michael Fuhrer, S M Anlage

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	Conference on Precision Electromagnetic Measurements
Editors	George Jones, Tom Lipe, Regis P Landim, Andrew Koffman
Place of Publication	New York USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	456 - 457
Number of pages	2
DOIs	https://doi.org/10.1109/CPEM.2012.6251000
Publication status	Published - 2012
Externally published	Yes
Event	Conference on Precision Electromagnetic Measurements (CPEM) 2012 - Washington, United States of America Duration: 1 Jan 2012 → …

Conference

Conference	Conference on Precision Electromagnetic Measurements (CPEM) 2012
Country/Territory	United States of America
City	Washington
Period	1/01/12 → …

Access to Document

10.1109/CPEM.2012.6251000

Cite this

Ghamsari, B. G., Tosado, J., Zhuravel, A. P., Yamamoto, M., Lenski, D. R., Ping, J., Fuhrer, M., & Anlage, S. M. (2012). Measuring the thickness of few-layer graphene by laser scanning microscopy. In G. Jones, T. Lipe, R. P. Landim, & A. Koffman (Eds.), Conference on Precision Electromagnetic Measurements (pp. 456 - 457). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/CPEM.2012.6251000

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title = "Measuring the thickness of few-layer graphene by laser scanning microscopy",

author = "Ghamsari, {B G} and Jacob Tosado and Zhuravel, {A P} and Mahito Yamamoto and Lenski, {Daniel R} and Jinglei Ping and Michael Fuhrer and Anlage, {S M}",

year = "2012",

doi = "10.1109/CPEM.2012.6251000",

language = "English",

pages = "456 -- 457",

editor = "George Jones and Tom Lipe and Landim, {Regis P} and Andrew Koffman",

booktitle = "Conference on Precision Electromagnetic Measurements",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "Conference on Precision Electromagnetic Measurements (CPEM) 2012 ; Conference date: 01-01-2012",

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Ghamsari, BG, Tosado, J, Zhuravel, AP, Yamamoto, M, Lenski, DR, Ping, J, Fuhrer, M & Anlage, SM 2012, Measuring the thickness of few-layer graphene by laser scanning microscopy. in G Jones, T Lipe, RP Landim & A Koffman (eds), Conference on Precision Electromagnetic Measurements. IEEE, Institute of Electrical and Electronics Engineers, New York USA, pp. 456 - 457, Conference on Precision Electromagnetic Measurements (CPEM) 2012, Washington, District of Columbia, United States of America, 1/01/12. https://doi.org/10.1109/CPEM.2012.6251000

Measuring the thickness of few-layer graphene by laser scanning microscopy. / Ghamsari, B G; Tosado, Jacob; Zhuravel, A P et al.
Conference on Precision Electromagnetic Measurements. ed. / George Jones; Tom Lipe; Regis P Landim; Andrew Koffman. New York USA: IEEE, Institute of Electrical and Electronics Engineers, 2012. p. 456 - 457.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Measuring the thickness of few-layer graphene by laser scanning microscopy

AU - Ghamsari, B G

AU - Tosado, Jacob

AU - Zhuravel, A P

AU - Yamamoto, Mahito

AU - Lenski, Daniel R

AU - Ping, Jinglei

AU - Fuhrer, Michael

AU - Anlage, S M

PY - 2012

Y1 - 2012

U2 - 10.1109/CPEM.2012.6251000

DO - 10.1109/CPEM.2012.6251000

M3 - Conference Paper

SP - 456

EP - 457

BT - Conference on Precision Electromagnetic Measurements

A2 - Jones, George

A2 - Lipe, Tom

A2 - Landim, Regis P

A2 - Koffman, Andrew

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - New York USA

T2 - Conference on Precision Electromagnetic Measurements (CPEM) 2012

Y2 - 1 January 2012

ER -

Ghamsari BG, Tosado J, Zhuravel AP, Yamamoto M, Lenski DR, Ping J et al. Measuring the thickness of few-layer graphene by laser scanning microscopy. In Jones G, Lipe T, Landim RP, Koffman A, editors, Conference on Precision Electromagnetic Measurements. New York USA: IEEE, Institute of Electrical and Electronics Engineers. 2012. p. 456 - 457 doi: 10.1109/CPEM.2012.6251000