Measuring the thickness of few-layer graphene by laser scanning microscopy

B G Ghamsari, Jacob Tosado, A P Zhuravel, Mahito Yamamoto, Daniel R Lenski, Jinglei Ping, Michael Fuhrer, S M Anlage

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

1 Citation (Scopus)
Original languageEnglish
Title of host publicationConference on Precision Electromagnetic Measurements
EditorsGeorge Jones, Tom Lipe, Regis P Landim, Andrew Koffman
Place of PublicationNew York USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages456 - 457
Number of pages2
DOIs
Publication statusPublished - 2012
Externally publishedYes
EventConference on Precision Electromagnetic Measurements (CPEM) 2012 - Washington, United States of America
Duration: 1 Jan 2012 → …

Conference

ConferenceConference on Precision Electromagnetic Measurements (CPEM) 2012
CountryUnited States of America
CityWashington
Period1/01/12 → …

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