Measuring dynamic phenomena at the sub-micron scale

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Abstract

measuring the spatio-temporal evolution of dynamic phenomena at sub-micron level is non-trivial due to the diffraction limit of optical systems. This paper describes a technique which allows imaging of sub-micron features of fluid-based phenomena, specifically the determination of their velocity and trajectory.

Original languageEnglish
Title of host publicationProceedings of the 2008 International Conference on Nanoscience and Nanotechnology, ICONN 2008
Pages129-132
Number of pages4
DOIs
Publication statusPublished - 24 Nov 2008
EventInternational Conference on Nanoscience and Nanotechnology (ICONN) 2008 - Melbourne Convention Centre, Melbourne, Australia
Duration: 25 Feb 200829 Feb 2008
Conference number: 2nd

Conference

ConferenceInternational Conference on Nanoscience and Nanotechnology (ICONN) 2008
Abbreviated titleICONN 2008
CountryAustralia
CityMelbourne
Period25/02/0829/02/08

Keywords

  • Component; sub-micron phenomena
  • Dynamics
  • Holography
  • PIV

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