Measuring dynamic phenomena at the sub-micron scale

Julio Soria; Omid Amili; Callum Atkinson

doi:10.1109/ICONN.2008.4639263

Measuring dynamic phenomena at the sub-micron scale

Julio Soria, Omid Amili, Callum Atkinson

Mechanical & Aerospace Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

3 Citations (Scopus)

Abstract

measuring the spatio-temporal evolution of dynamic phenomena at sub-micron level is non-trivial due to the diffraction limit of optical systems. This paper describes a technique which allows imaging of sub-micron features of fluid-based phenomena, specifically the determination of their velocity and trajectory.

Original language	English
Title of host publication	Proceedings of the 2008 International Conference on Nanoscience and Nanotechnology, ICONN 2008
Pages	129-132
Number of pages	4
DOIs	https://doi.org/10.1109/ICONN.2008.4639263
Publication status	Published - 24 Nov 2008
Event	International Conference on Nanoscience and Nanotechnology (ICONN) 2008 - Melbourne Convention Centre, Melbourne, Australia Duration: 25 Feb 2008 → 29 Feb 2008 Conference number: 2nd

Conference

Conference	International Conference on Nanoscience and Nanotechnology (ICONN) 2008
Abbreviated title	ICONN 2008
Country	Australia
City	Melbourne
Period	25/02/08 → 29/02/08

Keywords

Component; sub-micron phenomena
Dynamics
Holography
PIV

Access to Document

10.1109/ICONN.2008.4639263

Link to publication in Scopus

Cite this

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title = "Measuring dynamic phenomena at the sub-micron scale",

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