Measuring dynamic phenomena at the sub-micron scale

Julio Soria; Omid Amili; Callum Atkinson

doi:10.1109/ICONN.2008.4639263

Measuring dynamic phenomena at the sub-micron scale

Julio Soria, Omid Amili, Callum Atkinson

Mechanical & Aerospace Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

3 Citations (Scopus)

Abstract

measuring the spatio-temporal evolution of dynamic phenomena at sub-micron level is non-trivial due to the diffraction limit of optical systems. This paper describes a technique which allows imaging of sub-micron features of fluid-based phenomena, specifically the determination of their velocity and trajectory.

Original language	English
Title of host publication	Proceedings of the 2008 International Conference on Nanoscience and Nanotechnology, ICONN 2008
Pages	129-132
Number of pages	4
DOIs	https://doi.org/10.1109/ICONN.2008.4639263
Publication status	Published - 24 Nov 2008
Event	International Conference on Nanoscience and Nanotechnology (ICONN) 2008 - Melbourne Convention Centre, Melbourne, Australia Duration: 25 Feb 2008 → 29 Feb 2008 Conference number: 2nd

Conference

Conference	International Conference on Nanoscience and Nanotechnology (ICONN) 2008
Abbreviated title	ICONN 2008
Country/Territory	Australia
City	Melbourne
Period	25/02/08 → 29/02/08

Keywords

Component; sub-micron phenomena
Dynamics
Holography
PIV

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10.1109/ICONN.2008.4639263

Cite this

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title = "Measuring dynamic phenomena at the sub-micron scale",

abstract = "measuring the spatio-temporal evolution of dynamic phenomena at sub-micron level is non-trivial due to the diffraction limit of optical systems. This paper describes a technique which allows imaging of sub-micron features of fluid-based phenomena, specifically the determination of their velocity and trajectory.",

keywords = "Component; sub-micron phenomena, Dynamics, Holography, PIV",

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Soria, J, Amili, O & Atkinson, C 2008, Measuring dynamic phenomena at the sub-micron scale. in Proceedings of the 2008 International Conference on Nanoscience and Nanotechnology, ICONN 2008., 4639263, pp. 129-132, International Conference on Nanoscience and Nanotechnology (ICONN) 2008, Melbourne, Victoria, Australia, 25/02/08. https://doi.org/10.1109/ICONN.2008.4639263

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T1 - Measuring dynamic phenomena at the sub-micron scale

AU - Soria, Julio

AU - Amili, Omid

AU - Atkinson, Callum

N1 - Conference code: 2nd

PY - 2008/11/24

Y1 - 2008/11/24

N2 - measuring the spatio-temporal evolution of dynamic phenomena at sub-micron level is non-trivial due to the diffraction limit of optical systems. This paper describes a technique which allows imaging of sub-micron features of fluid-based phenomena, specifically the determination of their velocity and trajectory.

AB - measuring the spatio-temporal evolution of dynamic phenomena at sub-micron level is non-trivial due to the diffraction limit of optical systems. This paper describes a technique which allows imaging of sub-micron features of fluid-based phenomena, specifically the determination of their velocity and trajectory.

KW - Component; sub-micron phenomena

KW - Dynamics

KW - Holography

KW - PIV

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M3 - Conference Paper

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SN - 1424415047

SN - 9781424415045

SP - 129

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BT - Proceedings of the 2008 International Conference on Nanoscience and Nanotechnology, ICONN 2008

T2 - International Conference on Nanoscience and Nanotechnology (ICONN) 2008

Y2 - 25 February 2008 through 29 February 2008

ER -

Measuring dynamic phenomena at the sub-micron scale

Abstract

Conference

Keywords

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