Measuring chromatic aberration in imaging systems using plasmonic nano-particles

Sylvain D. Gennaro; Tyler R. Roschuk; Stefan A. Maier; Rupert F. Oulton

doi:10.1109/MetaMaterials.2015.7342467

Measuring chromatic aberration in imaging systems using plasmonic nano-particles

Sylvain D. Gennaro, Tyler R. Roschuk, Stefan A. Maier, Rupert F. Oulton

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Abstract

We demonstrate a novel method to measure chromatic aberrations of microscope objectives with metallic nano-particles using incoherent white light. Extinction spectra are recorded while scanning a single nano-particle through a lens's focal plane. We show a direct correlation between the focal wavelength and the longitudinal chromatic focal shift through analysis of the variations between scanned extinction spectra at each scan position and peak extinction over the entire scan. The method has been tested on achromat and apochromat objectives using aluminum nano-particles.

Original language	English
Title of host publication	2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2015
Place of Publication	United States
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	406-408
Number of pages	3
ISBN (Electronic)	9781479978366
DOIs	https://doi.org/10.1109/MetaMaterials.2015.7342467
Publication status	Published - 30 Nov 2015
Externally published	Yes
Event	International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2015 - Oxford, United Kingdom Duration: 7 Sept 2015 → 12 Sept 2015 Conference number: 9th

Conference

Conference	International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2015
Abbreviated title	METAMATERIALS 2015
Country/Territory	United Kingdom
City	Oxford
Period	7/09/15 → 12/09/15

Keywords

Adaptive optics
Aluminum
Apertures
Atmospheric measurements
Lenses
Optical sensors
Particle measurements

Access to Document

10.1109/MetaMaterials.2015.7342467

Cite this

Gennaro, S. D., Roschuk, T. R., Maier, S. A., & Oulton, R. F. (2015). Measuring chromatic aberration in imaging systems using plasmonic nano-particles. In 2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2015 (pp. 406-408). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/MetaMaterials.2015.7342467

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title = "Measuring chromatic aberration in imaging systems using plasmonic nano-particles",

abstract = "We demonstrate a novel method to measure chromatic aberrations of microscope objectives with metallic nano-particles using incoherent white light. Extinction spectra are recorded while scanning a single nano-particle through a lens's focal plane. We show a direct correlation between the focal wavelength and the longitudinal chromatic focal shift through analysis of the variations between scanned extinction spectra at each scan position and peak extinction over the entire scan. The method has been tested on achromat and apochromat objectives using aluminum nano-particles.",

keywords = "Adaptive optics, Aluminum, Apertures, Atmospheric measurements, Lenses, Optical sensors, Particle measurements",

author = "Gennaro, {Sylvain D.} and Roschuk, {Tyler R.} and Maier, {Stefan A.} and Oulton, {Rupert F.}",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2015, METAMATERIALS 2015 ; Conference date: 07-09-2015 Through 12-09-2015",

year = "2015",

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doi = "10.1109/MetaMaterials.2015.7342467",

language = "English",

pages = "406--408",

booktitle = "2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2015",

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Gennaro, SD, Roschuk, TR, Maier, SA & Oulton, RF 2015, Measuring chromatic aberration in imaging systems using plasmonic nano-particles. in 2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2015. IEEE, Institute of Electrical and Electronics Engineers, United States, pp. 406-408, International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2015, Oxford, United Kingdom, 7/09/15. https://doi.org/10.1109/MetaMaterials.2015.7342467

Measuring chromatic aberration in imaging systems using plasmonic nano-particles. / Gennaro, Sylvain D.; Roschuk, Tyler R.; Maier, Stefan A. et al.
2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2015. United States: IEEE, Institute of Electrical and Electronics Engineers, 2015. p. 406-408.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

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T1 - Measuring chromatic aberration in imaging systems using plasmonic nano-particles

AU - Gennaro, Sylvain D.

AU - Roschuk, Tyler R.

AU - Maier, Stefan A.

AU - Oulton, Rupert F.

N1 - Conference code: 9th

PY - 2015/11/30

Y1 - 2015/11/30

N2 - We demonstrate a novel method to measure chromatic aberrations of microscope objectives with metallic nano-particles using incoherent white light. Extinction spectra are recorded while scanning a single nano-particle through a lens's focal plane. We show a direct correlation between the focal wavelength and the longitudinal chromatic focal shift through analysis of the variations between scanned extinction spectra at each scan position and peak extinction over the entire scan. The method has been tested on achromat and apochromat objectives using aluminum nano-particles.

AB - We demonstrate a novel method to measure chromatic aberrations of microscope objectives with metallic nano-particles using incoherent white light. Extinction spectra are recorded while scanning a single nano-particle through a lens's focal plane. We show a direct correlation between the focal wavelength and the longitudinal chromatic focal shift through analysis of the variations between scanned extinction spectra at each scan position and peak extinction over the entire scan. The method has been tested on achromat and apochromat objectives using aluminum nano-particles.

KW - Adaptive optics

KW - Aluminum

KW - Apertures

KW - Atmospheric measurements

KW - Lenses

KW - Optical sensors

KW - Particle measurements

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BT - 2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2015

PB - IEEE, Institute of Electrical and Electronics Engineers

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T2 - International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2015

Y2 - 7 September 2015 through 12 September 2015

ER -

Gennaro SD, Roschuk TR, Maier SA, Oulton RF. Measuring chromatic aberration in imaging systems using plasmonic nano-particles. In 2015 9th International Congress on Advanced Electromagnetic Materials in Microwaves and Optics, METAMATERIALS 2015. United States: IEEE, Institute of Electrical and Electronics Engineers. 2015. p. 406-408 doi: 10.1109/MetaMaterials.2015.7342467

Measuring chromatic aberration in imaging systems using plasmonic nano-particles

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Keywords

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